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Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
更新时间:2025-01-10
    • Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator

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    • In the field of X-ray imaging technology, experts have reviewed the measurement methods of scintillation light yield and proposed a new absolute measurement method based on light collection coefficient correction, providing a solution for improving the spatial resolution of imaging systems and the development of new scintillation materials.
    • Chinese Journal of Luminescence   Pages: 1-12(2025)
    • DOI:10.37188/CJL.20240310    

      CLC:
    • CSTR:32170.14.CJL.20240310    
    • Published Online:10 January 2025

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  • ZHANG YUGE, MA GE, WAN PENGYING, et al. Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator. [J/OL]. Chinese journal of luminescence, 2025, 1-12. DOI: 10.37188/CJL.20240310. CSTR: 32170.14.CJL.20240310.

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