Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
|更新时间:2025-01-10
|
Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
增强出版
“In the field of X-ray imaging technology, experts have reviewed the measurement methods of scintillation light yield and proposed a new absolute measurement method based on light collection coefficient correction, providing a solution for improving the spatial resolution of imaging systems and the development of new scintillation materials.”
Chinese Journal of LuminescencePages: 1-12(2025)
作者机构:
1.清华大学 工程物理系,北京 100084
2.西安交通大学,微电子学院, 陕西 西安 710049
3.北京师范大学,核科学与技术学院,北京 100875
4.西北核技术研究院,陕西 西安 710024
作者简介:
基金信息:
the Major State Basic Research Development Program of China(2021YFB3201000);National Natural Science Foundation of China(12050005)
ZHANG YUGE, MA GE, WAN PENGYING, et al. Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator. [J/OL]. Chinese journal of luminescence, 2025, 1-12.
DOI:
ZHANG YUGE, MA GE, WAN PENGYING, et al. Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator. [J/OL]. Chinese journal of luminescence, 2025, 1-12. DOI: 10.37188/CJL.20240310. CSTR: 32170.14.CJL.20240310.
Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator增强出版