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Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
Invited Paper | 更新时间：2026-06-10

    • Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator

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    • Chinese Journal of Luminescence   Vol. 46, Issue 4, Pages: 630-641(2025)

    • DOI：10.37188/CJL.20240310    

      CLC： TL816+.1
    • CSTR：32170. 14. CJL. 20240310    

    • Received：29 November 2024，

      Revised：2024-12-18，

      Published：25 April 2025

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  • ZHANG Yuge,MA Ge,WAN Pengying,et al.Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator[J].Chinese Journal of Luminescence,2025,46(04):630-641. DOI： 10.37188/CJL.20240310. CSTR： 32170. 14. CJL. 20240310.

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Related Author

OUYANG Xiaoping
BAO Zizhen
WAN Pengying
MA Ge
OUYANG Xiao
Qiang QI
Meng MENG
Dong-zhou DING

Related Institution

College of Nuclear Science and Technology， Beijing Normal University
School of Microelectronics， Xi’an Jiaotong University
School of Materials Science and Engineering, University of Shanghai for Science and Technology
Shanghai Institute of Ceramics, Chinese Academy of Sciences
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
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