低色温无荧光粉LED光源的可靠性研究

李嘉祥; 潘拴; 刘军林; 吴小明

doi:10.3788/fgxb20204103.0323

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低色温无荧光粉LED光源的可靠性研究

器件制备及器件物理 | 更新时间：2020-08-12

- 低色温无荧光粉LED光源的可靠性研究
- Reliability of Low Color Temperature Phosphor-free LED Light Source
- 发光学报 2020年41卷第3期页码：323-330
- 作者机构：
  
  南昌大学国家硅基LED工程技术研究中心,江西南昌,330047
- 作者简介：
- 基金信息：
  
  国家重点研发计划（2016YFB0400600，2016YFB0400601）资助项目()
- DOI：10.3788/fgxb20204103.0323
  中图分类号： TN312+.8
- 纸质出版日期：2020-3-5，
  
  网络出版日期：2019-12-31，
  
  收稿日期：2019-11-15，
  
  修回日期：2019-12-31，
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李嘉祥, 潘拴, 刘军林等. 低色温无荧光粉LED光源的可靠性研究[J]. 发光学报, 2020,41(3): 323-330

LI Jia-xiang, PAN Shuan, LIU Jun-lin etc. Reliability of Low Color Temperature Phosphor-free LED Light Source[J]. Chinese Journal of Luminescence, 2020,41(3): 323-330
李嘉祥, 潘拴, 刘军林等. 低色温无荧光粉LED光源的可靠性研究[J]. 发光学报, 2020,41(3): 323-330 DOI： 10.3788/fgxb20204103.0323.

LI Jia-xiang, PAN Shuan, LIU Jun-lin etc. Reliability of Low Color Temperature Phosphor-free LED Light Source[J]. Chinese Journal of Luminescence, 2020,41(3): 323-330 DOI： 10.3788/fgxb20204103.0323.

摘要

为了对比研究新型低色温无荧光粉LED光源和低色温荧光粉LED光源的可靠性，本文进行了85℃加速老化和温度步进应力实验，测试了各光电参数在老化过程中的变化规律，并分析了有无荧光粉低色温光源的老化衰减机理。实验结果表明，在20 A/cm

工作电流密度、85℃的加速老化条件下，两种类型的光源都表现出很好的稳定性，但随着功率的增加，无荧光粉光源展现出更好的光通量稳定性；随着温度的升高，无荧光粉光源在高达200℃左右仍表现出良好的可靠性，而荧光粉光源则在175℃后出现了明显的光通量衰减和色温升高。电流应力或温度应力提升以后，无荧光粉光源展现出更优异的可靠性。

Abstract

For the comparative study of the reliability of the low color temperature light source made by phosphor-free LEDs and conventional phosphor-converted LEDs

85℃ accelerated aging and temperature step-stress tests were carried out. The variation of each photoelectric parameters during the aging process was recorded

and the aging mechanism of the two different kinds light sources was analyzed. The results show that both types of light sources exhibit good stability under the accelerated aging at 85℃ with a current density of 20 A/cm

. However

as the current density increases

more obvious attenuation of luminous flux appears in phosphor-converted light sources. As the temperature increases

the phosphor-free light source still shows good stability up to about 200℃. However

the phosphor-converted light sources exhibit significant luminous flux attenuation and color temperature increase after 175℃. These results indicate that the phosphor-free light source shows excellent reliability when current stress or temperature stress increases.

关键词

低色温无荧光粉LED光源可靠性老化

Keywords

low color temperaturephosphor-freeLED light sourcereliabilityaging

references

HOLONYAK N JR,BEVACQUA S F. Coherent (visible) light emission from Ga(As1-xPx) junction[J]. Appl. Phys. Lett., 1962,1(4):82-83.

NAKAMURA S,MUKAI T,SENOH M. Candela-class high-brightness InGaN/AlGaN double-heterostructure blue-light-emitting diodes[J]. Appl. Phys. Lett., 1994,64(13):1687-1689.

MUELLER-MACH R,MUELLER G O,KRAMES M R,et al.. High-power phosphor-converted light-emitting diodes based on Ⅲ-nitrides[J]. IEEE J. Sel. Top. Quantum Electron., 2002,8(2):339-345.

许巧云. LED植物照明技术及产业状况分析[J]. 光源与照明, 2016(2):33-35. XU Q Y. Analysis of LED plant lighting technology and industrial situation[J]. Lamps Light., 2016(2):33-35. (in Chinese)

裘燕青,张刘刘,陈苗根,等. 板上芯片集成封装发光二极管的光色检测系统[J]. 光学精密工程, 2016,24(1):39-44. QIU Y Q,ZHANG L L,CHEN M G,et al.. Photoelectric parameter measurement system for chip-on-board wafer level packaging LEDs[J]. Opt. Precision Eng., 2016,24(1):39-44. (in Chinese)

宋喜佳,刘维亚,陈伟,等. 基于相频空间稀疏性快速估计发光二极管灯点参数[J]. 光学精密工程, 2013,21(1):167-173. SONG X J,LIU W Y,CHEN W,et al.. Estimation of parameters for LED points based on sparsity of frequency offset-phase delay space[J]. Opt. Precision Eng., 2013,21(1):167-173. (in Chinese)

ALGVERE P V,MARSHALL J,SEREGARD S. Age-related maculopathy and the impact of blue light hazard[J]. Acta Ophthalmol. Scand., 2006,84(1):4-15.

BRAINARD G C,HANIFIN J P,GREESON J M,et al.. Action spectrum for melatonin regulation in humans:evidence for a novel circadian photoreceptor[J]. J. Neurosci., 2001,21(16):6405-6412.

ZHANG Z,WANG H J,WANG D R,et al.. Red light at intensities above 10 lx alters sleep-wake behavior in mice[J]. Light:Sci. Appl., 2017,6(5):e16231.

DENG J K,ZHANG H R,ZHANG X J,et al.. Enhanced luminescence performance of CaO:Ce3+,Li+,F- phosphor and its phosphor-in-glass based high-power warm LED properties[J]. J. Mater. Chem. C, 2018,6(15):4077-4086.

李琪,辛易. 蓝绿色硅酸盐荧光粉在低色温高显色LED中的应用[J]. 中国照明电器, 2017(4):16-19. LI Q,XIN Y. Application of silicate blue-green phosphor in low color temperature and high color rendering index LED[J]. China Light Light., 2017(4):16-19. (in Chinese)

ZHONG J S,CHEN D Q,CHEN X,et al.. Efficient rare-earth free red-emitting Ca2YSbO6:Mn4+,M(M=Li+,Na+,K+,Mg2+) phosphors for white light-emitting diodes[J]. Dalton Trans., 2018,47(18):6528-6537.

CHAKRABARTI M,THORSETH A,CORELL D,et al.. A white-cyan-red LED system for low correlated colour temperature lighting[J]. Light. Res. Technol., 2015,49(3):343-356.

杨厚云,盛建平,王晶. 两种低色温白光LED的性能比较[J]. 电子元件与材料, 2013,32(11):61-64. YANG H Y,SHENG J P,WANG J. Performance comparison on two kinds of low color temperature white LEDs[J]. Electr. Comp. Mater., 2013,32(11):61-64. (in Chinese)

刘军林,莫春兰,张建立,等. 五基色LED照明光源技术进展[J]. 照明工程学报, 2017,28(1):1-4. LIU J L,MO C L,ZHANG J L,et al.. Progress of five primary colours LED lighting source technology[J]. China Illumin. Eng. J., 2017,28(1):1-4. (in Chinese)

JIANG F Y,ZHANG J L,XU L Q,et al.. Efficient InGaN-based yellow-light-emitting diodes[J]. Photon. Res., 2019,7(2):144-148.

江风益,刘军林,张建立,等. 半导体黄光发光二极管新材料新器件新设备[J]. 物理学报, 2019,68(16):110-118. JIANG F Y,LIU J L,ZHANG J L,et al.. Semiconductor yellow light-emitting diodes[J]. Acta Phys. Sinica, 2019,68(16):110-118. (in Chinese)

LIN J Q,DING X W,HONG C,et al.. Several biological benefits of the low color temperature light-emitting diodes based normal indoor lighting source[J]. Sci. Rep., 2019,9(1):7560.

李德胜,邹琳,张云翠,等. 基于模糊综合评判法评价发光二极管灯具的可靠性[J]. 光学精密工程, 2012,20(12):2661-2666. LI D S,ZOU L,ZHANG Y C,et al.. Evaluation of reliability for LED lamp based on fuzzy algorithm[J]. Opt. Precision Eng., 2012,20(12):2661-2666. (in Chinese)

MENEGHESSO G,LEVADA S,PIEROBON R,et al.. Degradation mechanisms of GaN-based LEDs after accelerated DC current aging[C]. Digest. International Electron Devices Meeting,San Francisco,CA,USA, 2002:103-106.

MANYAKHIN F,KOVALEV A,YUNOVICH A E. Aging mechanisms of InGaN/AlGaN/GaN light-emitting diodes operating at high currents[J]. MRS Int. J. Nitr. Semicond. Res., 1998,3:e53.

CAO X A,SANDVIK P M,LEBOEUF S F,et al.. Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses[J]. Microelectr. Reliab., 2003,43(12):1987-1991.

李艳菲,张方辉,张静. 大功率LED的电流老化特性分析[J]. 发光学报, 2012,33(11):1236-1240. LI Y F,ZHANG F H,ZHANG J. The accelerated aging characterization of high power LED[J]. Chin. J. Lumin., 2012,33(11):1236-1240. (in Chinese)

张芹. 大功率LED模块温度湿度加速寿命试验研究[D]. 武汉:华中科技大学, 2011. ZHANG Q. Research on Temperature and Humidity Accelerated Life Testing of High-power Light-emitting Diode Module[D]. Wuhan:Huazhong University of Science and Technology, 2011. (in Chinese)

吴大辉,郭宁,张丽娜,等. 白光LED用红色荧光粉的最新研究进展[J]. 机械工程材料, 2015,39(9):6-11. WU D H,GUO N,ZHANG L N,et al.. Recent advances in red phosphors used in white LED[J]. Mater. Mechan. Eng., 2015,39(9):6-11. (in Chinese)

殷录桥,翁菲,宋朋,等. LED芯片与YAG荧光粉的相互热作用[J]. 光学学报, 2014,34(3):258-264. YIN L Q,WENG F,SONG P,et al.. Thermal interact effects of LED chip with YAG phosphor layer[J]. Acta Opt. Sinica, 2014,34(3):258-264. (in Chinese)

陈挺,陈志忠,林亮,等. GaN基白光LED的结温测量[J]. 发光学报, 2006,27(3):407-412. CHEN T,CHEN Z Z,LIN L,et al.. Methods for determining junction temperature of GaN-based white LEDs[J]. Chin. J. Lumin., 2006,27(3):407-412. (in Chinese)

樊星. 功率白光LED寿命评价技术研究[D]. 北京:北京工业大学, 2014. FAN X. Lifetime Evaluation Technology of White Power LED[D]. Beijing:Beijing University of Technology, 2014. (in Chinese)

赵阿玲,尚守锦,陈建新. 大功率白光LED寿命试验及失效分析[J]. 照明工程学报, 2010,21(1):48-52. ZHAO A L,SHANG S J,CHEN J X. Life test and failure mechanism analyses for high-power white LED[J]. China Illumin. Eng. J., 2010,21(1):48-52. (in Chinese)

方福波,王垚浩,宋代辉,等. 白光LED衰减的光谱分析[J]. 发光学报, 2008,29(2):353-357. FANG F B,WANG Y H,SONG D H,et al.. Spectroscopic analysis of white LED attenuation[J]. Chin. J. Lumin., 2008,29(2):353-357. (in Chinese)

LUO X B,FU X,CHEN F,et al.. Phosphor self-heating in phosphor converted light emitting diode packaging[J]. Int. J. Heat Mass Tran., 2013,58(1-2):276-281.

聂磊,项雯婧,李婳婧,等. 高温老化条件下LED模组封装材料失效研究[J]. 半导体光电, 2014,35(5):843-845. NIE L,XIANG W J,LI H J,et al.. Failure analysis of packaging materials of LED modules under high temperature aging test[J]. Semicond. Optoelectron., 2014,35(5):843-845. (in Chinese)

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