Na或Cu掺杂对Si/NiO异质结的光电性能影响

李彤; 王铁钢; 范其香; 刘真真; 王雅欣; 赵新为

doi:10.3788/fgxb20183906.0784

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Na或Cu掺杂对Si/NiO异质结的光电性能影响

材料合成及性能 | 更新时间：2020-08-12

- Na或Cu掺杂对Si/NiO异质结的光电性能影响
- Optical and Electrical Properties of Si/NiO Heterojunctions with and Without Na or Cu Doping
- 发光学报 2018年39卷第6期页码：784-789
- 作者机构：
  
  1. 天津职业技术师范大学电子工程学院, 天津 300222
  2. 天津职业技术师范大学机械工程学院, 天津 300222
  3. 东京理科大学物理系, 日本
- 作者简介：
- 基金信息：
  
  国家自然科学基金（51301181，51501130）();天津市高等学校创新团队培养计划（TD12-5043）();天津市应用基础与前沿技术研究计划重点项目（15JC
- DOI：10.3788/fgxb20183906.0784
  中图分类号： O484.4
- 纸质出版日期：2018-6-5，
  
  网络出版日期：2018-3-5，
  
  收稿日期：2017-9-27，
  
  修回日期：2018-2-26，
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李彤, 王铁钢, 范其香等. Na或Cu掺杂对Si/NiO异质结的光电性能影响[J]. 发光学报, 2018,39(6): 784-789

LI Tong, WANG Tie-gang, FAN Qi-xiang etc. Optical and Electrical Properties of Si/NiO Heterojunctions with and Without Na or Cu Doping[J]. Chinese Journal of Luminescence, 2018,39(6): 784-789
李彤, 王铁钢, 范其香等. Na或Cu掺杂对Si/NiO异质结的光电性能影响[J]. 发光学报, 2018,39(6): 784-789 DOI： 10.3788/fgxb20183906.0784.

LI Tong, WANG Tie-gang, FAN Qi-xiang etc. Optical and Electrical Properties of Si/NiO Heterojunctions with and Without Na or Cu Doping[J]. Chinese Journal of Luminescence, 2018,39(6): 784-789 DOI： 10.3788/fgxb20183906.0784.

摘要

利用磁控溅射方法制备了引入Na或Cu元素前后Si/NiO异质结。实验结果表明，Na元素引入后的Si/NiO：Na异质结的整流特性最佳。此时，Si/NiO：Na异质结光学透过率可以达到70%，这可能是由于Si/NiO：Na异质结的结晶质量较优、薄膜内缺陷少所致。Si/NiO：Na异质结

I-V

曲线的拟合结果显示界面态状态也会影响其整流特性。而Si/NiO和Si/NiO：Cu异质结都没能获得较好的整流特性，可能是薄膜内缺陷增多所致。这一结论得到了XRD、SEM、AFM和UV结果的支持。

Abstract

The Si/NiO heterojunctions with and without Na or Cu doping were prepared by the magnetron sputtering method. The best rectifying characteristics appears in the Si/NiO:Na heterojunction

where the average optical transmittance can reach to 70% in the visible range

which may be explained by the reduced defects due to the improved crystallization. The fitted

I-V

curve of Si/NiO:Na heterojunction indicates that the interface state also affects the rectifying property. Good rectifying property hasn't been observed in Si/NiO and Si/NiO:Cu heterojunctions because of the appearance of more defects. These results are also evidenced by XRD

SEM

AFM and UV results.

关键词

NiONa掺杂Cu掺杂异质结整流特性

Keywords

NiONa dopingCu dopingheterojunctionsrectifying property

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