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1. 发光学及应用国家重点实验室 中国科学院长春光学精密机械与物理研究所, 吉林 长春 130033
2. 中国科学院大学, 北京 100049
纸质出版日期:2014-12-3,
网络出版日期:2014-9-26,
收稿日期:2014-5-7,
修回日期:2014-6-15,
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李超群, 张振中, 谢修华等. Mg含量对Mg<sub><em>x</em></sub>Zn<sub>1-<em>x</em></sub>O:Ga薄膜电学性质的影响[J]. 发光学报, 2014,35(12): 1405-1409
LI Chao-qun, ZHANG Zhen-zhong, XIE Xiu-hua etc. Influence of Mg Content on The Electrical Property of Mg<sub><em>x</em></sub>Zn<sub>1-<em>x</em></sub>O:Ga Films[J]. Chinese Journal of Luminescence, 2014,35(12): 1405-1409
李超群, 张振中, 谢修华等. Mg含量对Mg<sub><em>x</em></sub>Zn<sub>1-<em>x</em></sub>O:Ga薄膜电学性质的影响[J]. 发光学报, 2014,35(12): 1405-1409 DOI: 10.3788/fgxb20143512.1405.
LI Chao-qun, ZHANG Zhen-zhong, XIE Xiu-hua etc. Influence of Mg Content on The Electrical Property of Mg<sub><em>x</em></sub>Zn<sub>1-<em>x</em></sub>O:Ga Films[J]. Chinese Journal of Luminescence, 2014,35(12): 1405-1409 DOI: 10.3788/fgxb20143512.1405.
通过金属有机物化学气相沉积法制备了不同Mg组分的Mg
x
Zn
1-
x
O:Ga(
x
=0
0.03
0.14)薄膜.透射谱中Mg
x
Zn
1-
x
O:Ga薄膜的光学带隙随
x
增大而出现的蓝移证实了Mg在ZnO晶格中的替位掺入.薄膜上金叉指电极间的变温
I-V
曲线显示
在同等温度下
Ga掺杂Mg
x
Zn
1-
x
O薄膜的电阻率随着
x
值的增大而逐渐升高.这是由于Mg组分增大使材料的导带底显著上升
Ga的施主能级深度增大
导致n型载流子浓度降低.根据
I-V
曲线计算了270 K温度下Mg
x
Zn
1-
x
O:Ga薄膜的浅能级施主深度.与
x
=0
0.03
0.14对应的施主能级深度分别为45.3
58.5
65 meV
说明随着薄膜Mg含量的升高
Ga的施主能级深度有增加的趋势.
Mg
x
Zn
1-
x
O:Ga (
x
=0
0.03
0.14) films were prepared by metal organic chemical vapor deposition method. The transmission spectra of Mg
x
Zn
1-
x
O:Ga films were measured. The optical band gap shows blue shifting on the transmission spectra with the increase of letter
x
. 12 pairs of interdigital electrodes were prepared on all Mg
x
Zn
1-
x
O:Ga films.
I-V
curves of Mg
x
Zn
1-
x
O:Ga films were measured at different temperature
and the temperature resistance curves of Mg
x
Zn
1-
x
O:Ga films were obtained under certain voltage. The normalized
R-T
curve shows that the resistance of Mg
x
Zn
1-
x
O:Ga films increases with the increasing of
x
at the same temperature. It is attributed to that the width of bandgap expands with the concentration of Mg ions
which leads to reduction of carrier concentration. The ionization energy for shallow donor impurities in the Mg
x
Zn
1-
x
O:Ga lattice was calculated. When the mole fraction of Mg is 0
3% and 14%
the ionization energy for shallow impurity is 45.3
58.5 and 65 meV
respectively. The data show that the ionization energy for Ga donor obviously increases with the increasing of Mg concentration .
MgZnOGa掺杂能级深度电阻
MgZnOGa dopedionization energyresistivity
Pintilie L, Pintilie I. Ferroelectrics: New wide-gap materials for UV detection [J]. Mat. Sci. Eng. B: Solid, 2001, 80(1-3):388-391.
Hsueh K P, Cheng Y C, Lin W Y, et al. Physical properties of Al-doped MgZnO film grown by RF magnetron sputtering using ZnO/MgO/Al2O3 target [J]. SPIE, 2011, 8110:81100X-1-6.
Liu W S, Liu Y H, Chen W K, et al. Transparent conductive Ga-doped MgZnO/Ag/Ga-doped MgZnO sandwich structure with improved conductivity and transmittance [J]. J. Alloys Compd., 2013, 564:105-113.
Su L X, Zhu Y, Zhang Q L, et al. Solar-blind wurtzite MgZnO alloy films stabilized by Be doping [J]. J. Phys. D: Appl. Phys., 2013, 46(24):245103-1-4
Zhang S B, Wei S H, Zunger A. Intrinsic n-type versus p-type doping asymmetry and the defect physics of ZnO [J]. Phys. Rev. B, 2001, 63(7):075205-1-6..
Look D C, Reynolds D C, Litton C W, et al. Characterization of homoepitaxial p-type ZnO grown by molecular beam epitaxy [J]. Appl. Phys. Lett., 2002, 81(10):1830-1832.
Tsukazaki A, Ohtomo A, Onuma T, et al. Repeated temperature modulation epitaxy for p-type doping and light-emitting diode based on ZnO [J]. Nat. Mater., 2005, 4(1):42-46.
Kato H, Sano M, Miyamoto K, et al. Growth and characterization of Ga-doped ZnO layers on a-plane sapphire substrates grown by molecular beam epitaxy [J]. J. Cryst. Growth, 2002, 237:538-543.
Honda T, Oda T, Mashiyama Y. Fabrication of c-axis oriented Ga-doped MgZnO-based UV transparent electrodes by molecular precursor method [J]. Phys. Stat. Sol. (c), 2010, 7(10):2471-2473..
Gao L L, Xu Y, Zhang M, et al. Effects of Mg contents on photoelectric properties and N doped behaviors in N doped MgZnO fims [J]. Opt. Precision Eng.(光学 精密工程), 2014, 22(5):1198-1203 (in Chinese).
Fan Y Y, Shen X H, Sang Y J. No reference image sharpness assessment based on contrast sensitivity [J]. Opt. Precision Eng.(光学 精密工程), 2011, 19(10): 2485-2493 (in Chinese).
Sze S M. Physics of Semiconductor Devices [M]. 3rd ed. Canada: Wiley-Interscience, 1969:25.
Meyer B K, Alves H, Hofmann D M, et al. Bound exciton and donor-acceptor pair recombinations in ZnO [J]. Phys. Stat. Sol. (b), 2004, 241(2):231-260.
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