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长春理工大学 高功率半导体激光国家重点实验室,吉林 长春,130022
纸质出版日期:2013-3-10,
收稿日期:2012-11-27,
修回日期:2013-1-12,
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王云华, 周路, 乔忠良, 高欣, 薄报学. 氩、氢混合等离子体处理对GaAs表面性质及发光特性的影响[J]. 发光学报, 2013,34(3): 308-313
WANG Yun-hua, ZHOU Lu, QIAO Zhong-liang, GAO Xin, BO Bao-xue. Effects of Ar and H<sub>2</sub> Plasma Treatment on The Surface Character and Luminescence Properties of GaAs Substrates[J]. Chinese Journal of Luminescence, 2013,34(3): 308-313
王云华, 周路, 乔忠良, 高欣, 薄报学. 氩、氢混合等离子体处理对GaAs表面性质及发光特性的影响[J]. 发光学报, 2013,34(3): 308-313 DOI: 10.3788/fgxb20133403.0308.
WANG Yun-hua, ZHOU Lu, QIAO Zhong-liang, GAO Xin, BO Bao-xue. Effects of Ar and H<sub>2</sub> Plasma Treatment on The Surface Character and Luminescence Properties of GaAs Substrates[J]. Chinese Journal of Luminescence, 2013,34(3): 308-313 DOI: 10.3788/fgxb20133403.0308.
介绍了一种氩、氢混合等离子体清洗GaAs基片的实验工艺
深入研究了氩、氢等离子体清洗GaAs表面污染物和氧化层
并活化表面性能的基本原理
同时讨论了气体流量、溅射功率和清洗时间等不同溅射参数对等离子体清洗效果的影响。结果表明
在氩气和氢气流量分别为10 cm
3
/min和30 cm
3
/min
溅射功率为20 W
清洗时间为15 min的条件下
GaAs样品的光致发光强度提高达139.12%
样品表面的AsO键和GaO键基本消失。
A new plasma cleaning process for GaAs surface using Ar/H
2
plasma was introduced in this paper. The process for Ar/H
2
plasma cleaning and surface activation was studied comprehensively to remove various contaminants
oxide layer on GaAs surface
and the influence of Ar/H
2
plasma under different plasma parameters was discussed in detail. The results show that GaAs samples treated under the condition of Ar
H
2
flow rate 10
30 cm
3
/min
sputtering power 20 W and cleaning time 15 min give the best cleaning effect
the photoluminescence intensity increases by 139.12%
and the AsO and GaO bonds on the GaAs surface decrease greatly.
等离子清洗GaAs基片发光强度
plasma cleaningGaAs substratesphotoluminescence intensity
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