大功率LED的电流老化特性分析

李艳菲; 张方辉; 张静

doi:10.3788/fgxb20123311.1236

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大功率LED的电流老化特性分析

器件制备及器件物理 | 更新时间：2020-08-12

- 大功率LED的电流老化特性分析
- The Accelerated Aging Characterization of High Power LED
- 发光学报 2012年33卷第11期页码：1236-1240
- 作者机构：
  
  陕西科技大学电气与信息工程学院,陕西西安,710021
- 作者简介：
- 基金信息：
  
  国家自然科学基金(61076066)();陕西省科技统筹创新工程计划(2011KTCQ01-09)资助项目()
- DOI：10.3788/fgxb20123311.1236
  中图分类号： TN312.8
- 纸质出版日期：2012-11-10，
  
  收稿日期：2012-7-17，
  
  修回日期：2012-9-20，
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李艳菲, 张方辉, 张静. 大功率LED的电流老化特性分析[J]. 发光学报, 2012,(11): 1236-1240

LI Yan-fei, ZHANG Fang-hui, ZHANG Jing. The Accelerated Aging Characterization of High Power LED[J]. Chinese Journal of Luminescence, 2012,(11): 1236-1240
李艳菲, 张方辉, 张静. 大功率LED的电流老化特性分析[J]. 发光学报, 2012,(11): 1236-1240 DOI： 10.3788/fgxb20123311.1236.

LI Yan-fei, ZHANG Fang-hui, ZHANG Jing. The Accelerated Aging Characterization of High Power LED[J]. Chinese Journal of Luminescence, 2012,(11): 1236-1240 DOI： 10.3788/fgxb20123311.1236.

摘要

基于一体化封装技术

先将铝基板进行硬质阳极氧化处理使其绝缘

后将蓝光LED芯片直接封装到铝基板上

分别制成大功率白光和蓝光LED

其中白光LED由蓝光芯片涂覆YAG:Ce荧光粉制成。将白光和蓝光LED分别用500 mA和700 mA电流加速老化1 000 h

平均每间隔24 h测试其各种光学参数

对比蓝光LED与白光LED的衰减情况。白光LED的光通量衰减比蓝光严重

但白光光功率的衰减比蓝光慢。LED的衰减分为两个阶段:第一阶段芯片与荧光粉同时衰减;第二阶段主要是芯片的衰减

荧光粉衰减较慢。

Abstract

Insulation layer of aluminum substrate for LED encapsulation was made by hard anodizing technology. White and blue GaN-based light-emitting diodes were encapsulated on the aluminum plate directly. White LED was fabricated by blue chip coated with YAG:Ce phosphor

while blue LED didn't coated with phosphor. Accelerated aging tests at 500 mA and 700 mA were carried out for about 1 000 h on the new type of integrated high-power. Then optical parameters of LEDs were tested per 24 h. Compared with the blue and white LED

we could get the following conclusions: White LED luminous flux attenuates seriously than the blue LED

while optical power is opposite. There are two stages in LED attenuation: The chip and phosphor decay at the same time in initial stage of aging

well blue chip attenuation is dominant after a certain period of time.

关键词

一体化封装LED老化失效分析

Keywords

integration packageLEDagingfailure mechanism

references

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