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上海大学 新型显示技术及应用集成教育部重点实验室 上海,200072
纸质出版日期:2012-10-10,
收稿日期:2012-6-5,
修回日期:2012-8-1,
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信恩龙, 李喜峰, 陈龙龙, 石继锋, 李春亚, 张建华. 射频磁控溅射低温制备非晶铟镓锌氧薄膜晶体管[J]. 发光学报, 2012,(10): 1149-1152
XIN En-long, LI Xi-feng, CHEN Long-long, SHI Ji-feng, LI Chun-ya, ZHANG Jian-hua. Fabrication of Amorphous Indium Gallium Zinc Oxide Thin Film Transistor at Low Temperature by RF Magnetron Sputtering[J]. Chinese Journal of Luminescence, 2012,(10): 1149-1152
信恩龙, 李喜峰, 陈龙龙, 石继锋, 李春亚, 张建华. 射频磁控溅射低温制备非晶铟镓锌氧薄膜晶体管[J]. 发光学报, 2012,(10): 1149-1152 DOI: 10.3788/fgxb20123310.1149.
XIN En-long, LI Xi-feng, CHEN Long-long, SHI Ji-feng, LI Chun-ya, ZHANG Jian-hua. Fabrication of Amorphous Indium Gallium Zinc Oxide Thin Film Transistor at Low Temperature by RF Magnetron Sputtering[J]. Chinese Journal of Luminescence, 2012,(10): 1149-1152 DOI: 10.3788/fgxb20123310.1149.
利用射频磁控溅射技术室温制备了铟镓锌氧(IGZO)薄膜
采用X射线衍射(XRD)表征薄膜的晶体结构
原子力显微镜(AFM)观察其表面形貌
分光光度计测量其透光率。结果表明:室温制备的IGZO薄膜为非晶态且薄膜表面均匀平整
可见光透射率大于80%。将室温制备的IGZO薄膜作为有源层
在低温(<200℃)条件下成功地制备了铟镓锌氧薄膜晶体管(a-IGZOTFT)
获得的a-IGZO-TFT器件的场效应迁移率大于6.0cm
2
·V
-1
·s
-1
开关比约为10
7
阈值电压为1.2V
亚阈值摆幅(
S
)约为0.9V/dec
偏压应力测试a-IGZOTFT阈值电压随时间向右漂移。
The indium gallium zinc oxide (IGZO) thin films were fabricated by RF magnetron sputtering at room temperature in this paper.The crystal structure
surface morphology
and optical electrical of the IGZO films were investigated by X-ray diffraction (XRD)
atom force microscopy (AFM)
and photometry
respectively.The results revealed that the IGZO film was amorphous
the surface of the films was uniform and smooth.A good optical transmittance of over 80% was obtained in the visible light.The IGZO thin film transistors were successfully fabricated at low temperature (<200℃) using the room temperature sputtering IGZO thin film as the active layer.The field effect mobility of a-IGZO TFT was larger than 6.0 cm
2
·V
-1
·s
-1
.The device's on/off ratio was 10
7
threshold voltage was 1.2 V and subthreshold voltage swing is 0.9 V/dec.Constant bias stress testing showed that the a-IGZO TFT threshold voltage exhibited positive shifts as time increased.
非晶铟镓锌氧薄膜薄膜晶体管场效应迁移率
amorphous indium gallium zinc oxide thin filmthin film transistorfield effect mobility
Nomural K,Ohta H,Takagi A,et al.Room-temperature fabrication of trans-parent flexible thin-film transistors using amorphous oxide semiconductors [J]. Nature,2004,432(7016):488-492.
Wager J F.Transparent electronics [J]. Science, 2003,300(5623):1245-1246.
Yabuta H,Sano M,Abe K,et al.High mobility thin film transistor with amorphous InGaZnO4 channel fabricated by room temperature RF-magnetron sputtering [J]. Appl.Phys.Lett., 2006,89(11):112123-1-3.
Kang D,Lim H,Kim C,et al.Amorphous gallium indium zinc oxide thin film transistors:Sensitive to oxygen molecules [J]. Appl.Phys.Lett.,2007,90(19):192101-1-3.
Lee J M,Cho I T,Lee J H,et al.Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors [J]. Appl.Phys.Lett.,2008,93(9):093504-1-4.
Lee J,Park J S,Pyo Y S,et al.The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors [J]. Appl.Phys.Lett., 2009,95(12):123502-1-3.
Sato A,Abe K,Hayashi R,et al.Amorphous In-Ga-Zn-O coplanar homojunction thin film transistor [J]. Appl.Phys.Lett.,2009,94(13):133502-1-3.
Sung S Y,Choi J H,Han U B,et al.Effects of ambient of atmosphere on the transfer characteristics and gate-bias stress stability of amorphous indium-gallium-zinc oxide thin-film transistors [J]. Appl.Phys.Lett., 2010,96(10):102107-1-3.
Suresh A,Muth J F.Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors [J]. Appl.Phys.Lett., 2008,92(3):033502-1-3.
Sato A,Abe K,Hayashi R,et al.Amorphous In-Ga-Zn-O coplanar homojunction thin-film transistor [J]. Appl.Phys.Lett.,2009,94(13):133502-1-3.
Li J,Zhou F,Lin H P,et al.Effect of N2O plasma treatment on the SiNx-based InGaZnO thin film transistors [J]. Chin.J.Lumin.(发光学报),2012,33(4):400-404 (in Chinese).
Kamiya T,Nomura K,Hosono H.Present status of amorphous In-Ga-Zn-O thin-film transistors [J]. Adv.Mater.,2010,11(4):044305-1-5.
Cross R,de Souza M.Investigating the stability of zinc oxide thin film transistors [J]. Appl.Phys.Lett.,2006,89(26):263513-1-3.
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