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Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
更新时间：2025-01-10
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    • Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator

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    • “In the field of X-ray imaging technology, experts have reviewed the measurement methods of scintillation light yield and proposed a new absolute measurement method based on light collection coefficient correction, providing a solution for improving the spatial resolution of imaging systems and the development of new scintillation materials.”
    • Chinese Journal of Luminescence   Pages: 1-12(2025)

    • DOI：10.37188/CJL.20240310    

      CLC：
    • CSTR：32170.14.CJL.20240310    

    • Published Online：10 January 2025，

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  • ZHANG Yuge,MA Ge,WAN Pengying,et al.Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator[J].Chinese Journal of Luminescence, DOI：10.37188/CJL.20240310 CSTR： 32170.14.CJL.20240310.

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