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Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator
Invited Paper | 更新时间：2025-04-21

    • Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator

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    • “In the field of X-ray imaging technology, experts have reviewed the measurement methods of scintillation light yield and proposed an absolute measurement method based on light collection coefficient correction, providing a solution for improving the spatial resolution of imaging systems and the development of new scintillation materials.”
    • Chinese Journal of Luminescence   Vol. 46, Issue 4, Pages: 630-641(2025)

    • DOI：10.37188/CJL.20240310    

      CLC： TL816+.1
    • CSTR：32170. 14. CJL. 20240310    

    • Received：29 November 2024，

      Revised：18 December 2024，

      Published：25 April 2025

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  • ZHANG Yuge,MA Ge,WAN Pengying,et al.Light Yield Measurement Technology and Optimization Methods of X-ray Imaging Scintillator[J].Chinese Journal of Luminescence,2025,46(04):630-641. DOI： 10.37188/CJL.20240310. CSTR： 32170. 14. CJL. 20240310.

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OUYANG Xiaoping
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Related Institution

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