功率高压LED模组在不同应力下的老化实验

雷珺; 郭伟玲; 李松宇; 谭祖雄

doi:10.3788/fgxb20163707.0804

您当前的位置：

首页 >

文章列表页 >

功率高压LED模组在不同应力下的老化实验

器件制备及器件物理 | 更新时间：2020-08-12

- 功率高压LED模组在不同应力下的老化实验
- Aging Experiments of High Voltage Power White LEDs Under Different Stresses
- 发光学报 2016年37卷第7期页码：804-808
- 作者机构：
  
  北京工业大学电控学院光电子技术省部共建教育部重点实验室北京,100124
- 作者简介：
- 基金信息：
  
  "();863"();国家高技术研究发展计划(2015AA03305)资助项目()
- DOI：10.3788/fgxb20163707.0804
  中图分类号： TN312.8
- 纸质出版日期：2016-7-5，
  
  收稿日期：2016-1-28，
  
  修回日期：2016-3-16，
扫描看全文
雷珺, 郭伟玲, 李松宇等. 功率高压LED模组在不同应力下的老化实验[J]. 发光学报, 2016,37(7): 804-808

LEI Jun, GUO Wei-ling, LI Song-yu etc. Aging Experiments of High Voltage Power White LEDs Under Different Stresses[J]. Chinese Journal of Luminescence, 2016,37(7): 804-808
雷珺, 郭伟玲, 李松宇等. 功率高压LED模组在不同应力下的老化实验[J]. 发光学报, 2016,37(7): 804-808 DOI： 10.3788/fgxb20163707.0804.

LEI Jun, GUO Wei-ling, LI Song-yu etc. Aging Experiments of High Voltage Power White LEDs Under Different Stresses[J]. Chinese Journal of Luminescence, 2016,37(7): 804-808 DOI： 10.3788/fgxb20163707.0804.

摘要

对LED进行应力加速老化实验及分析可以对器件可靠性做出最快、最有效的评估。本文将相同的6 V高压功率白光LED分为两组

一组施加180 mA电流应力和85℃温度应力进行高温老化实验

另一组施加180 mA电流应力、85℃高温和85%相对湿度进行高温高湿老化实验。在老化过程中

测试了LED光电参数随老化时间的变化规律。实验结果表明:高温大电流应力下的样品的光退化幅度为0.9%~3.4%

高温高湿大电流应力下的样品的光退化幅度为25.4%~27.8%

高温高湿下样品的老化程度远高于高温老化下样品的老化程度

湿度对LED可靠性有显著的影响。退化的原因包括荧光粉的退化和器件内部欧姆接触退化等。

Abstract

The stress accelerated aging test and analysis are the most efficient and effective way to analysis the reliability of the devices. In this paper

the same 6 V LED modules were divided into two groups for aging. 180 mA stress current and 85℃ high temperature were applied for one group

and 180 mA stress current and 85℃/85%RH moisture condition for another. During the aging time

the optical and electrical characteristics of the LEDs were measured and analyzed. The experimental results show that the degradation rate of the samples which under high temperature and high current stress is 3.4%-0.9%

and the degradation rate of the samples which under high humidity

high temperature and high current stress is 25.4%-27.8%. The degradation of LEDs under high temperature and high humidity condition is more serious than that under high temperature. So it is strong evidence that the humidity badly affects the reliability of LEDs. The failure reasons include the degradation of the phosphor and the Ohmic contact in the devices.

关键词

白光LED老化光通量光衰

Keywords

white LEDagingluminous fluxlight decay

references

李艳菲,张方辉,张静. 大功率LED的电流老化特性分析[J]. 发光学报, 2012, 33(11):1236-1240. LI Y F, ZHANG F H, ZHANG J. The accelerated aging characterization of high power LED[J]. Chin. J. Lumin., 2012, 33(11):1236-1240. (in Chinese)

陈奇,陈全,罗小兵. 加速可靠性试验中LED寿命的快速评估[J]. 工程热物理学报, 2014, 35(3):554-556. CHEN Q, CHEN Q, LUO X B. Fast estimation of LED's accelerated lifetime by online test method[J]. J. Eng. Thermophys., 2014, 35(3):554-556. (in Chinese)

薛浩,陈国龙,吕毅军,等. 两种高温老化方式对功率白光LED光热参数的影响[J]. 光电子激光, 2012, 23(5):849-854. XU H, CHEN G L, LV Y J, et al.. Influence of two kinds of high temperature degradation methods on the optical and thermal characteristics of power white LEDs[J]. J. Optoelectron. Laser, 2012, 23(5):849-854. (in Chinese)

肖雷,黄永忠,邱荣邦. LED模组恒定应力加速寿命试验[J]. 电子科学技术, 2014, 1(3):327-331. XIAO L, HUANG Y Z, QIU R B. Accelerated life test of constant stress of LED module[J]. Electron. Sci. Technol., 2014, 1(3):327-331. (in Chinese)

郑代顺,钱可元,罗毅. 大功率发光二极管的寿命试验及其失效分析[J]. 半导体光电, 2005, 26(2):87-91. ZHENG D S, QIAN K Y, LUO Y. Life test and failure mechanism analyses for high-power LED[J]. Semicond. Optoelectron., 2005, 26(2):87-91. (in Chinese)

周舟,冯士维,张光沉,等. GaN基大功率白光LED的高温老化特性[J]. 发光学报, 2011, 32(10):1046-1050. ZHOU Z, FENG S W, ZHANG G C, et al.. The aging characteristics of high-power GaN-based white light-emitting diodes[J]. Chin. J. Lumin., 2011, 32(10):1046-1050. (in Chinese)

KOH S, VAN DRIEL W, ZHANG G Q. Degradation of light emitting diodes:a proposed methodology[J]. J. Semicond., 2011, 32(1):014004-1-4.

王立彬,陈宇,刘志强,等. 大功率倒装结构LED芯片热模拟及热分析[J]. 半导体光电, 2007, 28(6):769-773. WANG L B, CHEN Y, LIU Z Q, et al.. Thermal simulation and analysis of high power flip-chip light-emitting diodes[J]. Semicond. Optoelectron., 2007, 28(6):769-773. (in Chinese)

陈海明. 国外白光LED技术与产业现状及发展趋势[J]. 半导体技术, 2010, 35(7):621-625. CHEN H M. Development and trends on white LED technology and industry in foreign countries[J]. Semicond. Technol., 2010, 35(7):621-625. (in Chinese)

YANG S C, LIN P, WANG C P, et al.. Failure and degradation mechanisms of high-power white light emitting diodes[J]. Microelectron. Reliab., 2010, 50(7):959-964.

MENEGHINI M, TAZZOLI A, MURA G, et al.. A review on the physical mechanisms that limit the reliability of GaN-based LEDs[J]. IEEE Trans. Electron Dev., 2010, 57(1):108-118.

ISHIZAKI S, KIMURA H, SUGIMOTO M. Lifetime estimation of high power white LEDs[J]. J. Light Vis. Environ., 2007, 31(1):11-18.

黄远鹏,陈德为,谢延兴. 大功率白光LED加速寿命试验方法与可靠性评估[J]. 现代建筑电气, 2012, 3(2):58-61. HUANG Y P, CHEN D W, XIE Y X. Summary of accelerated life test and reliability assessment for high-power white LED[J]. Mod. Architect. Electron., 2012, 3(2):58-61. (in Chinese)

WU B, LUO X, LIU S. Effect mechanism of moisture diffusion on LED reliability[C]. Proceedings of The 3rd Electronic System-Integration Technology Conference (ESTC), Berlin, Germany, 2010:1-5.

TAN C M, CHEN B K E, XIONG M. Study of humidity reliability of high power LEDs[C]. Proceedings of The 201010th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT), Shanghai, China, 2010:1592-1595.

DUPUIS R D, KRAMES M R. History, development, and applications of high-brightness visible light-emitting diodes[J]. J. Lightw. Technol., 2008, 26(9):1154-1171.

牛萍娟,王卫星,宁平凡,等. 温度对GaN基LED电流加速老化特性的影响[J]. 天津工业大学学报, 2015, 34(6):72-75. NIU P J, WANG W X, NING P F, et al.. Influence of temperate on current accelerated degradation characteristic of GaN white LED[J]. J. Tianjin Polytechn. Univ., 2015, 34(6):72-75. (in Chinese)

王艺燃,李月锋,邹军. 白光LED加速老化性能分析[J]. 中国照明电器, 2014(10):43-46. WANG Y R, LI Y F, ZOU J. White LED accelerated aging performance analysis[J]. China Light Lighting, 2014(10):43-46. (in Chinese)

浏览量

下载量

CSCD

文章被引用时，请邮件提醒。

提交

工具集

关联资源

白光LED的加速老化特性

白光LED用Mn⁴⁺激活氟氧化物红色荧光粉研究进展

利用乳糖酸的钝化效应提升K₂SiF₆∶Mn⁴⁺的耐湿性

荧光玻璃封装芯片级白光LED光热性能

用于白光LED的GGAG∶Ce复合荧光膜制备和性能