Enhanced Performance of Pure-red Perovskite Light-emitting Diodes by Surface Modification with Guanidine Acetate
Device Fabrication and Physics|更新时间:2024-04-26
|
Enhanced Performance of Pure-red Perovskite Light-emitting Diodes by Surface Modification with Guanidine Acetate
增强出版
“The latest research progress shows that adding guanidine acetate to the extraction agent to treat the surface of perovskite can significantly improve the performance and stability of perovskite light-emitting diodes. This strategy effectively reduces surface defects in the perovskite layer, increasing the fluorescence quantum yield from 64% to 79%. The maximum efficiency of the light-emitting diode reaches 11.66%, and the brightness is as high as 1285 cd · m-2, which is significantly better than the untreated reference device.”
Chinese Journal of LuminescenceVol. 45, Issue 4, Pages: 637-643(2024)
作者机构:
1.中国科学院 半导体研究所, 半导体材料科学重点实验室, 北京 100083
2.中国科学院大学 材料科学与光电技术学院, 北京 100049
作者简介:
基金信息:
Strategic Priority Research Program of Chinese Academy of Sciences(XDB43000000)
SHI Mingming,JIANG Ji,ZHANG Xingwang.Enhanced Performance of Pure-red Perovskite Light-emitting Diodes by Surface Modification with Guanidine Acetate[J].Chinese Journal of Luminescence,2024,45(04):637-643.
SHI Mingming,JIANG Ji,ZHANG Xingwang.Enhanced Performance of Pure-red Perovskite Light-emitting Diodes by Surface Modification with Guanidine Acetate[J].Chinese Journal of Luminescence,2024,45(04):637-643. DOI: 10.37188/CJL.20230336.
Enhanced Performance of Pure-red Perovskite Light-emitting Diodes by Surface Modification with Guanidine Acetate增强出版
Red Low-threshold Amplified Spontaneous Emission of Perovskite Films Achieved by A-site Substitution and Defect Passivation
Regulation of Perovskite Crystallization Process and Its Mechanism Based on Green Anti-solvent Engineering
Review of Advances in Large-area Perovskite Solar Cell Thin-film Fabrication Techniques
Related Author
SHI Mingming
JIANG Ji
ZHANG Xingwang
WANG Liang
YAN Mengtong
LI Yan
LYU Mei
LU Hongbo
Related Institution
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences
Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology
School of Chemistry and Chemical Engineering, Hefei University of Technology
Anhui Provincial Engineering Research Center of Semiconductor Inspection Technology and Instrument, Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, School of Instrument Science and Opto-electronics Engineering, Hefei University of Technology
R&D Institute of Fluid and Powder Engineering, Dalian University of Technology