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1. 中国科学院长春光学精密机械与物理研究所, 激发态物理重点实验室, 吉林, 长春, 130033
2. 中国科学院 研究生院 北京,100049
收稿日期:2007-08-25,
修回日期:2007-11-24,
纸质出版日期:2008-01-20
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武晓杰, 张吉英, 张振中, 申德振, 刘可为, 李炳辉, 吕有明, 李炳生, 赵东旭, 姚斌, 范希武. Fe掺杂对CdS光学特性的影响[J]. 发光学报, 2008,29(1): 144-148
WU Xiao-jie, ZHANG Ji-ying, ZHANG Zheng-zhong, SHEN De-zhen, LIU Ke-wei, LI Bing-hui, LÜ You-ming, LI Bing-sheng, ZHAO Dong-xu, YAO Bin, FAN X W. Fe Doping Effects on Optical Properties of CdS[J]. Chinese Journal of Luminescence, 2008,29(1): 144-148
武晓杰, 张吉英, 张振中, 申德振, 刘可为, 李炳辉, 吕有明, 李炳生, 赵东旭, 姚斌, 范希武. Fe掺杂对CdS光学特性的影响[J]. 发光学报, 2008,29(1): 144-148 DOI:
WU Xiao-jie, ZHANG Ji-ying, ZHANG Zheng-zhong, SHEN De-zhen, LIU Ke-wei, LI Bing-hui, LÜ You-ming, LI Bing-sheng, ZHAO Dong-xu, YAO Bin, FAN X W. Fe Doping Effects on Optical Properties of CdS[J]. Chinese Journal of Luminescence, 2008,29(1): 144-148 DOI:
采用低压金属有机化学气相沉积技术
在固定源流量的条件下
通过调节衬底温度(270~360℃)生长了不同Fe掺杂浓度的CdS薄膜。光谱测量表明低铁掺杂对CdS晶格振动的影响较小
但对光致发光性质影响较为明显。样品的光致发光谱包括两部分:2.5eV附近带-带跃迁的发光以及2.0~2.4eV之间与缺陷相关的发光。随着铁含量的增加
带-带跃迁逐渐被抑制
发光光谱被缺陷相关的发光主导
同时薄膜的电导也由n型转为p型
说明Fe离子掺入在薄膜引入了受主杂质。通过不同激发密度下的光致发光光谱测量
我们将2.0~2.4eV的发光归结为铁受主相关的D-A对发射
并根据掺杂浓度和发光峰位置估算了Fe受主的能级位置。
Dilute magnetic semiconductors(DMSs)
such as MnGaAs
MnCdTe
CoZnO
and FeZnO
offer the great opportunity to integrate the magnetic
electrical
and optical advantages into a single semiconductor material. Therefore
DMSs attract more and more interests for the application in spintronics field. However
incorporation of transition metal ions will inevitably effects on the optical and electrical properties when the magnet functionalities are introduced into semiconductors. Besides the quenching behavior in fluorescence due to the complex energy level system
the effect of transition metal ions on conduction of the matrix is not neglectable because of the alterable valence. In present work
we found that doping of Fe ions changes the conduction type of the CdS thin films form n-to p-type. The Fe related donor-acceptor pairs emission was discussed by photoluminescence (PL) characterization. Cd
1-x
Fe
x
S thin films with different Fe contents were grown on c-plane sapphire substrate by low-pressure metal organic chemical vapor deposition. Dimethyl cadmium
iron pentacarbonyl and H
2
S were used as precursors
flow rates of which were fixed at 3.51×10
-6
3.77×10
-7
and 1.62×10
-5
mol/min by separate mass-flow controllers
respectively. High purity hydrogen (99.999%) was used as carrier gas with total flow rate of 1.9 liter/min. The growth was performed for 30 min
and the thickness of samples ranges from 500 to 700 nm. A Lake Shore 7707 Hall measurement system was employed to measure the electrical properties of the thin films. PL measurements were performed on a JY-630 micro-Raman spectrometer in a backscattering geometry configuration. The excitation source for the PL is the 325 nm line of a He-Cd laser. The Fe contents in samples A
B
C
D
and E are 0.0025
0.0072
0.0149
0.0455
and 0.1400
respectively
which were measured by energy dispersion spectroscopy. The resistivity of the thin films was found to increase with the addition of more Fe contents into the Cd
1-x
Fe
x
S thin films
and eventually the conductivity of Cd
1-x
Fe
x
S thin film reverses from n-to p-type at high density Fe doping. Because the samples were Cd-rich
the acceptors can be only offered by Fe ions doped into the CdS films. The p-type conduction was attributed to the ionization of holes from trivalent Fe ions
which was formed by the oxidation of Fe
2+
ion near the sample surface. With increasing Fe content
the band-to-band transition at 2.5 eV was suppressed while the emission located at 2.0~2.4 eV finally dominated the PL spectra. Under various excitation density
the PL emission located at 2.0~2.4 eV shows significant evolvement. The intensity of high-energy side of this emission increases more rapidly than that of the low-energy side with increasing excitation density. Therefore
the emission at 2.0~2.4 eV was attributed to donor-acceptor pairs. According to the PL peak position and carrier density obtained by electrical measurement
the energy level of Fe acceptor was calculated to be about 320 meV by using the formula.
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