CAO Yu-lian, WANG Le, LIAO Xin-sheng, CHENG Dong-ming, LIU Yun, WANG Li-jun. Reliability of High-power Semiconductor Laser Diodes[J]. Chinese Journal of Luminescence, 2003,24(1): 100-102
CAO Yu-lian, WANG Le, LIAO Xin-sheng, CHENG Dong-ming, LIU Yun, WANG Li-jun. Reliability of High-power Semiconductor Laser Diodes[J]. Chinese Journal of Luminescence, 2003,24(1): 100-102DOI:
The reliability of coated and uncoated mirror facets InGaAs/GaAs and InGaAsP/GaAs high- power semiconductor lasers has been studied through aging experiment. The threshold current and output light power of the lasers were tested before aging
and it showed that the threshold current of the lasers with coated facets is decreased by a factor of 4 than that of lasers with uncoated facets. Then both kinds of lasers were tested after aging at 1.2 times of the threshold current for 40h.It showed that the threshold current was increased by more than 25mA
and output light power decreased more than 50% compared to those of without aging. So to lenghtened the lifetime of lasers
it is important that the mirrors facets must be coated.