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1.School of Ocean, Shanwei Institute of Technology, Shanwei 516600, China
2.Novel Energy Materials & Catalysis Research Center, Shanwei Marine Industry Institute, Shanwei 516600, China
3.School of Microelectronics, South China University of Technology, Guangzhou 510640, China
Published:2022-01,
Received:12 October 2021,
Revised:27 October 2021,
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Cite this article
Cong WANG, Yu-rong LIU, Qiang PENG, et al. Bias Stress Stability of Electric-double-layer ZnO Thin-film Transistor. [J]. Chinese Journal of Luminescence 43(1):129-136(2022)
Cong WANG, Yu-rong LIU, Qiang PENG, et al. Bias Stress Stability of Electric-double-layer ZnO Thin-film Transistor. [J]. Chinese Journal of Luminescence 43(1):129-136(2022) DOI: 10.37188/CJL.20210324.
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