X-ray detection has been extensively used in medical diagnosis, security inspection, and industrial non-destructive detection etc. In recent years, metal halide perovskite X-ray detectors have attracted much attention due to their advantages such as high sensitivity, low detection limit and low cost. Compared with polycrystalline perovskite films, single crystal perovskites exhibit much lower trap density, higher carrier mobility-lifetime product, better uniformity and stability due to absence of grain boundaries, which are conducive to boost the performance of X-ray detectors. In this review, we first introduce the basic principle and the key performance parameters of X-ray detection to clarify the advantages of single crystal perovskite for direct X-ray detectors. Then, we review the research progress of single crystal perovskite direct X-ray detection and imaging. Specifically, the influence of crystal quality, composition regulation and structure of device of the single crystal perovskite on X-ray detection performance are systematically analyzed. Finally, we discussed the technical challenges and potential solutions faced by single crystal perovskite X-ray detectors, and provided a brief outlook on the development trends in the field.
关键词
single crystal perovskite;direct X-ray detection;crystallization quality;composition regulation;device structure