Development of X-ray Detectors Based on Wide-bandgap Semiconductor

WU Xuan ,  

GAO Runlong ,  

LIU Zhiyu ,  

ZHONG Xiangli ,  

LIU Linyue ,  

OUYANG Xiaoping ,  

摘要

High-performance semiconductor X-ray detectors prefer outstanding characteristics including low detection of limit, low dark current, high sensitivity, fast response time, high radiation hardness and so on. Wide-bandgap semiconductors such as silicon carbide (SiC), gallium nitride (GaN), diamond, gallium oxide (Ga2O3), and zinc oxide (ZnO) exhibit exceptional properties, including a wide bandgap, high electron mobility, high breakdown field strength, high saturated carrier drift velocity, and large displacement energy. These characteristics enable them to demonstrate superior performance in X-ray detection, meeting the requirements for high-performance semiconductor X-ray detectors and making them highly promising candidates for such applications.As a result, they have emerged as promising candidates for advanced X-ray detectors.In this paper, the electrical properties, preparation technology and detection performance of SiC, GaN, diamond, Ga₂O₃, ZnO X-ray detectors are introduced, and the latest research is discussed. Meanwhile, future research directions and potential applications of wide-bandgap semiconductor X-ray detectors in medical imaging, industrial detection and space exploration conduct in-deep thinking.

关键词

wide-bandgap;semiconductor;X-ray detector;gallium nitride;silicon carbide;diamond

阅读全文