High Temperature Surface Temperature Measurement Based on Phosphorescent Intensity Ratio
|更新时间:2025-06-06
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High Temperature Surface Temperature Measurement Based on Phosphorescent Intensity Ratio
“The latest research has broken through the upper limit of phosphorescence intensity ratio temperature measurement technology and developed Dy3+doped YAG/YAP phosphorescent coatings, achieving high-precision two-dimensional temperature distribution measurement in the range of 650 K to 1300 K.”
Chinese Journal of LuminescencePages: 1-12(2025)
作者机构:
1.中国计量大学 光学与电子信息学院, 浙江 杭州 310018
2.北京长城计量测试技术研究所, 北京 100095
作者简介:
基金信息:
the Science and Technology on Metrology and Calibration Laboratory(JLKG2023001B006)
YE Chengke,CAI Jing,ZHAN Chunlian,et al.High Temperature Surface Temperature Measurement Based on Phosphorescent Intensity Ratio[J].Chinese Journal of Luminescence,
YE Chengke,CAI Jing,ZHAN Chunlian,et al.High Temperature Surface Temperature Measurement Based on Phosphorescent Intensity Ratio[J].Chinese Journal of Luminescence,DOI:10.37188/CJL.20250134 CSTR: 32170.14.CJL.20250134.
High Temperature Surface Temperature Measurement Based on Phosphorescent Intensity Ratio