您当前的位置:
首页 >
文章列表页 >
Influence of 2 nm GaAs Insertion Layer on 905 nm InGaAs Multi Quantum Well Luminescence
Synthesis and Properties of Materials | 更新时间:2024-12-20
    • Influence of 2 nm GaAs Insertion Layer on 905 nm InGaAs Multi Quantum Well Luminescence

      增强出版
    • The latest research reveals that GaAs insertion layer can optimize the surface roughness and crystal quality of InGaAs multi quantum well materials, enhance the luminescence effect, and provide new directions for research in related fields.
    • Chinese Journal of Luminescence   Vol. 45, Issue 12, Pages: 2011-2020(2024)
    • DOI:10.37188/CJL.20240243    

      CLC: O482.31
    • Published:25 December 2024

      Received:30 September 2024

      Revised:17 October 2024

    移动端阅览

  • GAN Lulu,WANG Haizhu,ZHANG Chong,et al.Influence of 2 nm GaAs Insertion Layer on 905 nm InGaAs Multi Quantum Well Luminescence[J].Chinese Journal of Luminescence,2024,45(12):2011-2020. DOI: 10.37188/CJL.20240243.

  •  
  •  

0

Views

17

下载量

0

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Growth of InGaAs/GaAsP Strain-compensated Multiple Quantum Wells via MOCVD Technology
Barrier Thickness Designing of InGaN/GaN Multiple Quantum Well for Electroluminescence
Structure Optimization of Multiple Quantum Wells in Near Ultraviolet Light Emitting Diodes with 380 nm Wavelength
EFFECT OF ELECTRIC FIELD ON ZnCdTe-ZnTe MULTIPLE QUANTUM WELLs

Related Author

MA Xiaohui
WANG Dengkui
WANG Zhensheng
ZHAO Shucun
ZHANG Chong
WANG Haizhu
Hai-zhu WANG
Xu WANG

Related Institution

State Key Laboratory of High Power Semiconductor Lasers, Changchun University of Science and Technology
Department of Applied Physics, China Agriculture University
State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences
Laboratory of Nanophotonic Functional Materials and Devices, Institute of Opto-Electronic Materials and Technology, South China Normal University
Changchun Institute of Physics, Chinese Academy of Sciences
0