Analysis of Failure Mechanism of Reverse Leakage Current in GaN-based Micro-LEDs
Device Fabrication and Physics|更新时间:2026-09-12
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Analysis of Failure Mechanism of Reverse Leakage Current in GaN-based Micro-LEDs
增强出版
Chinese Journal of LuminescenceVol. 45, Issue 9, Pages: 1539-1546(2024)
作者机构:
1.无锡学院 江苏省集成电路可靠性技术及检测系统工程研究中心, 江苏 无锡 214105
2.南京信息工程大学 电子与信息工程学院, 江苏 南京 210044
作者简介:
基金信息:
Funding Project: Talent Initiation Research Project at Nanjing University of Information Science & Technology, Binjiang College (2019 r005, 550219005)、Horizontal Integration(2019 r005;550219005);Horizontal Integration(2021320205000041;2023320205000242;2023320205000242;560124081)
WANG Wei,ZHANG Tengfei,WANG Shouyu.Analysis of Failure Mechanism of Reverse Leakage Current in GaN-based Micro-LEDs[J].Chinese Journal of Luminescence,2024,45(09):1539-1546.
WANG Wei,ZHANG Tengfei,WANG Shouyu.Analysis of Failure Mechanism of Reverse Leakage Current in GaN-based Micro-LEDs[J].Chinese Journal of Luminescence,2024,45(09):1539-1546.DOI: 10.37188/CJL.20240164.
Analysis of Failure Mechanism of Reverse Leakage Current in GaN-based Micro-LEDs增强出版