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A Novel Two-dimensional SiO2 Structure and Influence of In-plane Strain on Its Photoelectric Properties: First-principles Study
Theoretical Calculation and Spectral Analysis | 更新时间:2023-09-06
    • A Novel Two-dimensional SiO2 Structure and Influence of In-plane Strain on Its Photoelectric Properties: First-principles Study

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    • Chinese Journal of Luminescence   Vol. 44, Issue 8, Pages: 1496-1504(2023)
    • DOI:10.37188/CJL.20230072    

      CLC: O482.31
    • Published:05 August 2023

      Received:24 March 2023

      Revised:11 April 2023

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  • LIU Xueting,LIU Yucheng,ZHAO Ziang,et al.A Novel Two-dimensional SiO2 Structure and Influence of In-plane Strain on Its Photoelectric Properties: First-principles Study[J].Chinese Journal of Luminescence,2023,44(08):1496-1504. DOI: 10.37188/CJL.20230072.

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Related Author

Liu Xueting
Zhang Yong
Feng Ming
CHEN Jinliang
QU Dan
ZHAO Wenxin
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Related Institution

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National Supercomputing Center in Shenzhen
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