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Degradation Mechanism of Pd/p-GaN Ohmic Contacts
Luminescence Industry and Technology Frontier | 更新时间:2021-07-22
    • Degradation Mechanism of Pd/p-GaN Ohmic Contacts

    • Chinese Journal of Luminescence   Vol. 42, Issue 7, Pages: 1065-1073(2021)
    • DOI:10.37188/CJL.20210092    

      CLC: O482.31
    • Published:01 July 2021

      Received:16 March 2021

      Revised:04 April 2021

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  • Fan ZHANG, Rong-xin WANG, Si-yi HUANG, et al. Degradation Mechanism of Pd/p-GaN Ohmic Contacts. [J]. Chinese Journal of Luminescence 42(7):1065-1073(2021) DOI: 10.37188/CJL.20210092.

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Related Author

Fan ZHANG
Rong-Xin WANG
Si-yi HUANG
Ai-qin TIAN
Jian-Ping LIU
Hui YANG
XU Liu-yang
GAO Xin

Related Institution

Vacuum Interconnected Nanotech Workstation, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences
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State Key Laboratory of High Power Semiconductor Lasers, Changchun University of Science and Technology
State Key Laboratory of Electronic Thin Films and Integrated Devices, Zhongshan Institute, University of Electronic Science and Technology of China
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