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昆明理工大学 材料科学与工程学院, 云南 昆明 650093
Received:24 August 2020,
Accepted:2020-9-14,
Published:2020-12
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Chao WANG, Rong-bin WANG, Hao ZHANG, et al. Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications[J]. Chinese journal of luminescence, 2020, 41(12): 1554-1566.
Chao WANG, Rong-bin WANG, Hao ZHANG, et al. Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications[J]. Chinese journal of luminescence, 2020, 41(12): 1554-1566. DOI: 10.37188/CJL.20200254.
稀土或过渡金属离子掺杂荧光材料因其环保、易于制备、高效率、低成本、长发光寿命、全光谱、高亮度等性能在多重防伪、光学信息存储、温度传感等众多领域具有广泛的应用,特别是在LED照明领域。然而,荧光材料热稳定性差是阻碍其快速发展的核心问题。近年来,关于在热扰动作用下,缺陷态对载流子的俘获及释放过程,作为抑制LED用荧光材料热猝灭效应的有效途径被广泛研究。本文主要概述了LED用荧光材料中缺陷态对其热稳定性影响的研究现状,以及缺陷态作为陷阱中心对载流子的俘获、释放及其抑制LED用荧光材料热猝灭效应的机理,并对当前研究中存在的问题进行了总结和展望。
Rare earth or transition metal ions doped into fluorescent materials have a wide range of applications
such as multiple anti-counterfeiting
optical information storage
temperature sensing and other fields because of its environmental protection
easy preparation
high efficiency
low cost
long luminous life
full spectrum
high brightness
especially in the LED lighting field. However
the poor thermal stability of fluorescent materials is still a significantly challenge
which limits its rapidly applied development
particularly in the high temperature environments. Recently
under the excited of thermal disturbance
the capture and release processes of carriers from defect structure have been widely studied as an effective way to suppress the thermal quenching effect of fluorescent materials. This paper mainly focused on the summaries on the effect of the defect structures on the thermal stabilities of the fluorescent material. Besides
the influence of the defects structures
acting as the trapping centers
on the capturing and releasing processes of carriers
and the suppressing process of thermal quenching phenomenon are also summarized. Finally
the above critical issues in the current research are summarized and prospected.
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