Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications

Chao WANG; Rong-bin WANG; Hao ZHANG; Zhi-chao LIU; Xiu-xia YANG; Hong-yu LYU; Yi-yu CAI; Xue YU; Jian-bei QIU; Xu-hui XU

doi:10.37188/CJL.20200254

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Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications

Invited Paper | 更新时间：2020-12-10

- Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications
- Chinese Journal of Luminescence Vol. 41, Issue 12, Pages: 1554-1566(2020)
- 作者机构：
  
  昆明理工大学材料科学与工程学院, 云南昆明 650093
- 作者简介：
- 基金信息：
  
  National Natural Science Foundation of China;National Natural Science Foundation of China;Yunnan Ten Thousand Talents Plan Young & Elite Talents Project;Yunnan Ten Thousand Talents Plan Young & Elite Talents Project
- DOI：10.37188/CJL.20200254
  CLC： O482.31
- Received：24 August 2020，
  
  Accepted：2020-9-14，
  
  Published：2020-12
- 稿件说明：
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Chao WANG, Rong-bin WANG, Hao ZHANG, et al. Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications[J]. Chinese journal of luminescence, 2020, 41(12): 1554-1566.
DOI：

Chao WANG, Rong-bin WANG, Hao ZHANG, et al. Effect of Defect Structure on Thermal Stability of Fluorescent Materials for LED Applications[J]. Chinese journal of luminescence, 2020, 41(12): 1554-1566. DOI： 10.37188/CJL.20200254.

摘要

稀土或过渡金属离子掺杂荧光材料因其环保、易于制备、高效率、低成本、长发光寿命、全光谱、高亮度等性能在多重防伪、光学信息存储、温度传感等众多领域具有广泛的应用，特别是在LED照明领域。然而，荧光材料热稳定性差是阻碍其快速发展的核心问题。近年来，关于在热扰动作用下，缺陷态对载流子的俘获及释放过程，作为抑制LED用荧光材料热猝灭效应的有效途径被广泛研究。本文主要概述了LED用荧光材料中缺陷态对其热稳定性影响的研究现状，以及缺陷态作为陷阱中心对载流子的俘获、释放及其抑制LED用荧光材料热猝灭效应的机理，并对当前研究中存在的问题进行了总结和展望。

Abstract

Rare earth or transition metal ions doped into fluorescent materials have a wide range of applications

such as multiple anti-counterfeiting

optical information storage

temperature sensing and other fields because of its environmental protection

easy preparation

high efficiency

low cost

long luminous life

full spectrum

high brightness

especially in the LED lighting field. However

the poor thermal stability of fluorescent materials is still a significantly challenge

which limits its rapidly applied development

particularly in the high temperature environments. Recently

under the excited of thermal disturbance

the capture and release processes of carriers from defect structure have been widely studied as an effective way to suppress the thermal quenching effect of fluorescent materials. This paper mainly focused on the summaries on the effect of the defect structures on the thermal stabilities of the fluorescent material. Besides

the influence of the defects structures

acting as the trapping centers

on the capturing and releasing processes of carriers

and the suppressing process of thermal quenching phenomenon are also summarized. Finally

the above critical issues in the current research are summarized and prospected.

关键词

Keywords

references

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