JIA Tian-ying, ZHAN Run-ze, DONG Cheng-yuan. Simulation of The Stability of a-IGZO TFT-OLED Pixel Circuits[J]. Chinese Journal of Luminescence, 2013,34(9): 1240-1244
JIA Tian-ying, ZHAN Run-ze, DONG Cheng-yuan. Simulation of The Stability of a-IGZO TFT-OLED Pixel Circuits[J]. Chinese Journal of Luminescence, 2013,34(9): 1240-1244 DOI: 10.3788/fgxb20133409.1240.
Amorphous In-Ga-Zn-O thin film transistors (a-IGZO TFTs) have potentials to be used in pixel circuits of active matrix organic light emitting display (AMOLED). However
bias stress effect still involves a-IGZO TFTs
evidently influencing performance of the corresponding AMOLED pixel circuits. In this study
inverted-staggered a-IGZO TFT devices were fabricated and measured
following which the corresponding Spice model was created. In addition
the dependence of stress time on threshold voltage (
V
th
) shift was theoretically modeled. By using SPICE simulation tool
we studied the stability properties of a-IGZO TFT-OLED pixel circuits in the forms of 2T1C and 3T1C
which proves there exists somewhat compensation effect on the
V
th
shift in 3T1C pixel circuit. Finally
we discussed and analyzed the way to further improve stability of a-IGZO TFT-OLED pixel circuits.
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references
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