有机/有机界面污染对有机电致发光器件稳定性的影响

张新稳; 吴朝新

doi:10.3788/fgxb20133406.0763

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有机/有机界面污染对有机电致发光器件稳定性的影响

器件制备及器件物理 | 更新时间：2020-08-12

- 有机/有机界面污染对有机电致发光器件稳定性的影响
- Effect of Contaminated Organic/Organic Interface on The Stability of Organic Light-emitting Devices
- 发光学报 2013年34卷第6期页码：763-768
- 作者机构：
  
  1. 南京邮电大学有机电子与信息显示国家重点实验室培育基地,江苏南京,210023
  2. 西安交通大学电子与信息工程学院信息光子技术省重点实验室,陕西西安,710049
- 作者简介：
- 基金信息：
  
  国家重点基础研究计划(2009CB930600,2012CB723402)();国家自然科学基金(61204048)();江苏省高校自然科学研究项目(12KJB5100
- DOI：10.3788/fgxb20133406.0763
  中图分类号： TN383.1
- 收稿日期：2013-02-24，
  
  修回日期：2013-04-19，
  
  纸质出版日期：2013-06-10
- 稿件说明：
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张新稳, 吴朝新. 有机/有机界面污染对有机电致发光器件稳定性的影响[J]. 发光学报, 2013,34(6): 763-768

ZHANG Xin-wen, WU Zhao-xin. Effect of Contaminated Organic/Organic Interface on The Stability of Organic Light-emitting Devices[J]. Chinese Journal of Luminescence, 2013,34(6): 763-768
张新稳, 吴朝新. 有机/有机界面污染对有机电致发光器件稳定性的影响[J]. 发光学报, 2013,34(6): 763-768 DOI： 10.3788/fgxb20133406.0763.

ZHANG Xin-wen, WU Zhao-xin. Effect of Contaminated Organic/Organic Interface on The Stability of Organic Light-emitting Devices[J]. Chinese Journal of Luminescence, 2013,34(6): 763-768 DOI： 10.3788/fgxb20133406.0763.

摘要

有机电致发光器件的稳定性是其实用化面临的主要难题之一。为了研究有机/有机界面性质对有机电致发光器件稳定性的影响

采用溶液旋涂的NPB(NPB

)作为器件的空穴传输层制备了两种异质结电致发光器件:ITO/NPB

/Alq

/LiF/Al和ITO/NPB

/NPB/Alq

/LiF/Al

对比研究了器件的发光性能和工作稳定性。研究结果表明:完全使用NPB

作为空穴传输层的器件性能和稳定性都较差

这归因于不稳定的NPB

/Alq

界面

在空气中旋涂制备NPB层时

空气中的水蒸气和氧气分子会粘附在空穴传输层表面

这样就会引起界面处Alq

分子的发光猝灭。插入10 nm真空蒸镀的NPB层可以显著地提高器件的发光性能和稳定性

10 nm的NPB层把污染界面与激子复合区界面分开

避免了水蒸气和氧气分子对Alq

分子的发光猝灭

器件的效率增加了1.15 cd/A

半衰期寿命提高了4倍。

Abstract

Two types of organic light-emitting devices were fabricated using a spin-coated N

N'-di(naphth-1-yl)-N

N'-diphenyl-benzidine (NPB

) film as hole-transport layer (HTL): ITO/NPB

/Alq

/LiF/Al

ITO/NPB

/NPB/Alq

/LiF/Al. The effect of air contaminated NPB

/organic interface on the stability of organic light-emitting devices was investigated. It is found that the device using a NPB

film as HTL exhibited the poorer stability

which is attributed to the instability of NPB

/Alq

interface that contaminated by moisture and oxygen from the NPB

layer. A vacuum-deposited NPB film (10 nm) inserted between NPB

layer and Alq

layer can greatly improve the stability of device by blocking the recombination zone from contamination of moisture and oxygen.

关键词

Keywords

references

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