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1. 天津职业技术师范大学 电子工程学院 天津,300222
2. 东京理科大学 物理系 东京,日本
收稿日期:2013-01-24,
修回日期:2013-04-18,
纸质出版日期:2013-06-10
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李彤, 介琼, 张宇, 倪晓昌, 赵新为. 工作气压对ZnO∶Mn薄膜结构特性的影响[J]. 发光学报, 2013,34(6): 711-715
LI Tong, JIE Qiong, ZHANG Yu, NI Xiao-chang, ZHAO Xin-wei. Influence of Working Pressure on The Structural Properties of ZnO∶Mn Thin Films[J]. Chinese Journal of Luminescence, 2013,34(6): 711-715
李彤, 介琼, 张宇, 倪晓昌, 赵新为. 工作气压对ZnO∶Mn薄膜结构特性的影响[J]. 发光学报, 2013,34(6): 711-715 DOI: 10.3788/fgxb20133406.0711.
LI Tong, JIE Qiong, ZHANG Yu, NI Xiao-chang, ZHAO Xin-wei. Influence of Working Pressure on The Structural Properties of ZnO∶Mn Thin Films[J]. Chinese Journal of Luminescence, 2013,34(6): 711-715 DOI: 10.3788/fgxb20133406.0711.
利用射频磁控溅射方法在玻璃衬底上沉积了一系列ZnO:Mn薄膜
结合Raman光谱、XRD衍射谱和SEM分析了工作气压对ZnO:Mn薄膜结构特性的影响。 Raman拟合光谱显示
在工作气压从1 Pa增加至4 Pa的过程中
ZnO:Mn薄膜始终保持着六角纤锌矿结构。 但是
随着气压的降低
对应于E
2
(High)振动模式的Raman散射峰以及与Mn掺杂相关的特征峰左移
说明在低工作气压时
ZnO:Mn薄膜内晶格缺陷更多
晶格更加无序。这一结论也得到了XRD和SEM结果的证实。
ZnO:Mn thin films were prepared on glass substrates using RF magnetron sputtering method. Raman spectroscopy
X-ray diffraction spectra and SEM were used to analyze the structural characteristics of ZnO:Mn films with the different working pressure. The results show that ZnO:Mn thin films have the significant wurtzite structure with the different working pressure. The leftshifts of the Raman peaks corresponding to E
2
(High) mode and related to Mn doping are explained by the appearance of much more lattice defects and disorder in ZnO:Mn films with decreasing working pressure
which are also evidenced by XRD and SEM results.
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