This paper manifested a catastrophic damage due to electrical damage during the measurement. However

electrical surge is caused by external conditions such as an electrical biasing situation

as a result

the p-n junction is damaged or breakdown so that the current-voltage relation become electrically short at the instantaneous current

which can be manifested from the

P-I

curve and

V-I

characteristics: a sudden decrease in light output power is observed

moreover

the voltage is no longer changing dependence on the increasing of current with the drop-off of output power. According to N. I. Katasavets

et al

.

a conclusion can be made that fact overheating at

J

<

2 000/cm

2

in all types of LDs is due to the absorption of intrinsic laser radiation at the facet and to process nonradiative surface recombination. Facet overheating has superlinear dependence on output optical power. Then through the scanning electron microscopy (SEM)

we indeed find that the melting region occured

also there is cracks at the facet which may be brought by the stress-induced by cleaving to form the facets

so laser no longer stimulated emitting

by contrast

another rapid degration is also shown in the paper

at the same time

both degrations were analyzed on the basis of theory

which manifested the degration of laser are principally due to material

structure and process of the laser

electrical surge is only accelerate the degration which origined from material or fabrication

but it is still important to understand the catastrophic or rapid damage related to electrical surge during the device measuring.