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1. 中国科学技术大学物理系
2. 中国科学技术大学, 国家同步辐射实验室,安徽 合肥,230029
3. 中国科学院安徽光学精密机械研究所,安徽 合肥,230061
收稿日期:2000-06-18,
修回日期:2001-01-21,
纸质出版日期:2001-08-30
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魏亚光, 施朝淑, 周东方, 陶德节, 汤洪高. 紫外激光晶体Ce<sup>3+</sup>:LiSrAlF<sub>6</sub>发光温度依赖中的陷阱效应[J]. 发光学报, 2001,22(3): 258-262
WEI Ya-guang, SHI Chao-shu, ZHOU Dong-fang, TAO De-jie, TANG Hong-gao. Traps Effect on Temperature Dependence of Luminescent Intensity of Ce<sup>3+</sup>:LiSrAlF<sub>6</sub> UV Laser Crystal[J]. Chinese Journal of Luminescence, 2001,22(3): 258-262
魏亚光, 施朝淑, 周东方, 陶德节, 汤洪高. 紫外激光晶体Ce<sup>3+</sup>:LiSrAlF<sub>6</sub>发光温度依赖中的陷阱效应[J]. 发光学报, 2001,22(3): 258-262 DOI:
WEI Ya-guang, SHI Chao-shu, ZHOU Dong-fang, TAO De-jie, TANG Hong-gao. Traps Effect on Temperature Dependence of Luminescent Intensity of Ce<sup>3+</sup>:LiSrAlF<sub>6</sub> UV Laser Crystal[J]. Chinese Journal of Luminescence, 2001,22(3): 258-262 DOI:
在105~300K温区内
测量了X射线激发下Ce
3+
:LiSrAlF
6
晶体发光强度的温度依赖(IT)
在237~300K温区内发光强度有特殊的增强结构
结合105~300K温区内热释光的测量
证实这种发光强度的增强效应是由于陷阱参与发光过程所导致。通过对热释光曲线的进一步分析
得到深度分别为051eV和055eV的陷阱能级
这些陷阱主要源于Ce
3+
取代Sr
2+
所形成的杂质缺陷和基质LiSrAlF
6
中的F
-
空位以及Li
+
空位所形成的本征缺陷。
Ce
3+
:LiSrAlF
6
crystal is a solid state laser material potentially capable of efficiently producing tunable ultraviolet (UV) output. Recent results suggest that it may be the most efficient continuously tunable
rare earth doped UV laser material reported to date. There are some defects in Ce
3+
:LiSrAlF
6
crystal. These defects will affect the laser and luminescence properties of crystal. In this paper
the temperature dependence of luminescent intensity (
I-T
) of Ce
3+
:LiSrAlF
6
crystal with X-ray excitation from 105K to 300K has been studied. The luminescent intensity is enhanced " specially " in the range of 237~300K
which is probably caused by traps. In order to verify our surmise
we investigated the thermoluminescence of Ce
3+
:LiSrAlF
6
crystal from 105~300K with X-ray excitation at 105K for two minutes. From 237~300K
two peaks locate at 258K and 274K respectively. These two peaks are accord to two kinds of traps
whose depth are 0.51eV (258K) and 0.55eV (274K). Comparing
I-T
curve with TL curve
the enhanced part of
I-T
curve is coincided with temperature range in which TL peaks locate. Because the TL peaks originate from traps
we suggest that the special structure of
I-T
curve is caused by the traps effect. That is
during the period of measuring the
I-T
at lower temperature
some charge carriers relax to luminescent center and luminesce
while some other charge carriers is captured by traps. The release probability of bonded carriers is described as Cexp(-
E/kT
)
where C is a constant
E
is the depth of trap and
T
is temperature. With the temperature rising
the bonded charge carriers will release from the traps at higher temperature
via conduct band then relax to luminescent center and give out light
which make the intensity of luminescence enhanced. The origination of defects of Ce
3+
:LiSrAlF
6
crystal is discussed too. It is primary that Ce
3+
occupies the sublattice of Sr
2+
in Ce
3+
:LiSrAlF
6
crystal
forming CeSr
3+
defect. Generally
fluorine vacancies (
V
F
) always exist in fluoride. Ce Sr
3+
and
V
F
are negative charge center
which form electron traps. The lithium vacancies (
V
Li
) are principal positive charges
which compensate the negative charge Ce Sr
3+
and
V
F
V
Li
form hole traps. In conclusion
the "special" structures of
I-T
curve in the range of 237~300K is explained by the traps effect
which is verified by means of TL. The depths of two traps are 0.51eV and 0.55eV respectively. These traps mainly originate from CeSr
3+
and some intrinsic defects such as
V
F
and
V
Li
.
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