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中国科学院, 激发态物理重点实验室, 吉林, 长春, 130033
收稿日期:2006-08-25,
修回日期:2006-09-24,
纸质出版日期:2006-11-20
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蒋红, 宋航, 缪国庆. MOCVD-Ga<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>P<sub>1-y</sub>/InPDBR结构的晶格振动[J]. 发光学报, 2006,27(6): 967-970
JIANG Hong, SONG Hang, MIAO Guo-qing. Lattice Vibrations of MOCVD-Ga<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>P<sub>1-y</sub>/InP DBRs Structures[J]. Chinese Journal of Luminescence, 2006,27(6): 967-970
蒋红, 宋航, 缪国庆. MOCVD-Ga<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>P<sub>1-y</sub>/InPDBR结构的晶格振动[J]. 发光学报, 2006,27(6): 967-970 DOI:
JIANG Hong, SONG Hang, MIAO Guo-qing. Lattice Vibrations of MOCVD-Ga<sub>x</sub>In<sub>1-x</sub>As<sub>y</sub>P<sub>1-y</sub>/InP DBRs Structures[J]. Chinese Journal of Luminescence, 2006,27(6): 967-970 DOI:
利用微区Raman散射技术研究了MOCVD-Ga
x
In
1-x
As
y
P
1-y
/InPDBRs结构的晶格振动。在InP衬底上生长的与InP晶格匹配的四元合金Ga
0.4
In
0.6
As
0.85
P
0.15
中包含三种主要的振动模式
分别归属于类InAs、类GaAs和类GaInP。随着Ga
0.4
In
0.6
As
0.85
P
0.15
与InP交替生长构成的DBRs结构周期数增加
Raman散射谱中三种振动模式的谱线线型发生明显变化
类InAs振动强度不变
谱线窄化
峰值位置向低频方向移动
类GaAs和类GaInP振动强度逐渐减弱。同时类InAs与类GaAs振动强度比增大。Raman散射研究中声子的限制效应表明多层结构生长过程中界面存在非完整晶态。
The lattice vibrations of the MOCVD-Ga
x
In
1-x
As
y
P
1-y
epilayers and MOCVD-Ga
x
In
1-x
As
y
P
1-y
/InP Distributed Bragg reflectors(DBRs) are investigated by micro-Raman scattering techniques. The used DBRs samples were formed with Ga
0.4
In
0.6
As
0.85
P
0.15
/InP alternative layers grown on the S-doped high quality (100) InP substrates in an atmospheric or low pressure metal organic chemical vapor deposition(MOCVD) system made up in our laboratory. The lattice constant and composition parameters(
x
y
) were determined using double crystal X-ray diffraction
scanning electronic microscope-photoelectron spectra and photoluminescence(PL) measurements. Raman spectra were measured at room temperature using the 488 nm line of Ar ion laser as an exciting source. The Raman signal was collected in the near back-scattering configuration and analyzed with a monochromator. The Raman spectra exhibit three major modes of vibrations in the quaternary alloy Ga
0.4
In
0.6
As
0.85
P
0.15
grown on the InPsubstrates. They are attributed to InAs-like
GaAs-like and GaInP-like
respectively. The Raman spectra line-shape of the three major modes of vibrations clearly changed with the increasing of period number of DBR. The intensity of the InAs-like vibration is not changed
but its full width at half-maximum(FWHM) narrowed
the peak value location moved in the direction of the low-frequency. The intensity of the GaAs-like and GaInP-like gradually weaken. Ratio of intensities of InAs- and GaAs-like vibrations increased with the increasing of period number of DBR. The quaternary alloy Ga
0.4
In
0.6
As
0.85
P
0.15
was in the region of immiscibility. It was found that the surfaces of the samples grown in the region of immisicibility are rough. The interface quality between the Ga
0.4
In
0.6
As
0.85
P
0.15
and InPwas effected. The restrictive effect of the phonon in the Raman scattering investigations showed that the non-integrity crystalloid appeared during the growth of the multi-layer structure.
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