Cheng Lichun, Deng Zhenbo, Xu Xurong. THE CHOICE OF PREHEATING AND ACCERATING LAYERS IN NEW DEVICE[J]. Chinese Journal of Luminescence, 1995,16(2): 124-129
Cheng Lichun, Deng Zhenbo, Xu Xurong. THE CHOICE OF PREHEATING AND ACCERATING LAYERS IN NEW DEVICE[J]. Chinese Journal of Luminescence, 1995,16(2): 124-129DOI:
Accoding to the calculation of hot electron impact cross section by Shen
the blue emission could be get if the hot electron have enough energy.In order to get hot electrons of relative high energy
first we choice SiO
2
/Ta
2
O
5
and SiO
2
/Y
2
O
3
complex layers as preheat layer to substitute for SiO and to prepare the devices whose preheating layers were SiO
2
/Ta
2
O
5
SiO
2
/Y
2
O
3
and SiO for samples A
B
C respectively.The electroluminescence intensity and transferred current were mesaured by using HITACH 4010 model flurescence spectrophotometer and Chen and Krupta circuit respectively.The maxmum emission intensity of C is larger one order than that of B and two order than that of A.In the mean time
the ratio among the transferred current of A and that of B and that of C is 3.9:1.8:1.0 Accoding to the following luminescence equation and experiment date
we got tile maxmum hot electron energy ill A.B
C is 0.4
0.5 and 1.5eV respectively.Then we choice ZnS and SiO
2
as accerating layer
prepared the device 2603 and 2502 respectively. The derivation electronluminscence intensity and transferred charge excited by different polaration voltage have been measured
The ratio between the electroluminescent intensity caused by electron accerated by SiO
2
and that by ZnS is 20.0:1.0.In the mean time
the transferred charge from ZnS side is larger than that from SiO
2
.Accoding to the luminescent intensity
we got the following result: the ZnS layer is prefer to provide more but low energy electrons
and SiO
2
is prefer to provide smaller quantity but high energy hot electron.Till now
it is obviously that the SiO and SiO
2
are accepterable preheating and accerating layer respectively in new designed devices.