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1. 中国科学院长春物理研究所
2. 上海科技大学
纸质出版日期:1986-05-30
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田华, 范希武, 许少鸿. 退火对Er<sup>3+</sup>离子注入ZnSe晶体电致发光的影响[J]. 发光学报, 1986,7(2): 184-192
Tian Hua, Fan Xiwu. THE EFFECT OF ANNEALING ON THE ELECTROLUMINESCENCE OF Er<sup>3+</sup>-IMPLANTED ZnSe CRYSTALS[J]. Chinese Journal of Luminescence, 1986,7(2): 184-192
本文研究了低阻ZnSe晶体在室温下经Er
3+
离子注入后
退火对它的电学及电致发光性能的影响。文中指出
经N
2
气保护退火所制备的ZnSe:Er
3+
二极管具有MIS结构
I层是由于晶格损伤造成的。文中根据对I层起因的分析
首次提出和实现了在熔融锌中退火可使品格损伤墓本消除
从而制备了掺Er的ZnSeMS二极管
在反向电压下得到Er
3+
离子的特征发光。
Implantation of rare-earth ion into ZnS and ZnSe has been used for fabrication of LEDs with MS structure.The implantation processes were carried out by using an ion beam energy of 20keV and with the substrate at 77K.In the present experiments
erbium ions were implanted into ZnSe with the substrate at 300K.After annealing the ZnSe:Er
3+
crystal in N
2
atmosphere
ZnSe:Er
3+
LED with MIS structure was fabricated.According to the reason of I layer forming
we first proposed that the I layer could be eliminated by annealing Er
3+
-implanted ZnSe crystals in melten zinc and the LED with MS structure could be fabricated.ZnSe crystals were grown from the vapour phase in sealed capsules con-tainting slight excess of zinc in our laboratory.Dice with dimensions of 6×6×1mm
3
were annealed in melten zinc to reduce their resistivities to the range of 1-10Ω·cm.Erbium ions with energy of 100keV and dose of 1×10
15
cm
-2
were implanted into ZnSe substrate at room temperature.Annealing was performed in N
2
atmosphere or in melten zinc
respectively.
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