ZnS:Cu, Nd, Cl薄膜直流电致发光的激发态寿命和光谱强度

钟国柱; F. J. Bryant

doi:null

您当前的位置：

首页 >

文章列表页 >

ZnS:Cu, Nd, Cl薄膜直流电致发光的激发态寿命和光谱强度

电致发光 | 更新时间：2020-08-11

- ZnS:Cu, Nd, Cl薄膜直流电致发光的激发态寿命和光谱强度
- THE LIFETIMES OF EXCITED STATES AND SPECTRAL INTENSITIES OF DCEL IN ZnS:Cu, Nd, Cl THIN FILMS
- 发光学报 1982年3卷第2期页码：22-28
- 作者机构：
  
  1. 中国科学院长春物理研究所
  2. 英国Hull大学物理系
- 作者简介：
- 基金信息：
- DOI：
  中图分类号：
- 收稿：1982-03-26，
  
  纸质出版：1982-05-30
- 稿件说明：
移动端阅览
钟国柱, F. J. Bryant. ZnS:Cu, Nd, Cl薄膜直流电致发光的激发态寿命和光谱强度[J]. 发光学报, 1982,3(2): 22-28

Zhong Guo-zhu, F. J. Bryant. THE LIFETIMES OF EXCITED STATES AND SPECTRAL INTENSITIES OF DCEL IN ZnS:Cu, Nd, Cl THIN FILMS[J]. Chinese Journal of Luminescence, 1982,3(2): 22-28
钟国柱, F. J. Bryant. ZnS:Cu, Nd, Cl薄膜直流电致发光的激发态寿命和光谱强度[J]. 发光学报, 1982,3(2): 22-28 DOI：

Zhong Guo-zhu, F. J. Bryant. THE LIFETIMES OF EXCITED STATES AND SPECTRAL INTENSITIES OF DCEL IN ZnS:Cu, Nd, Cl THIN FILMS[J]. Chinese Journal of Luminescence, 1982,3(2): 22-28 DOI：

摘要

在真空中用共蒸发方法制的直流电致发光薄膜ZnS:Cu

实验中测量了它的可见和红外发射。本文研究了Nd

离子的各个激发态的寿命各个辐射波长的发射强度与温度和外加电压的关系

发现导带中参与电致发光激发过程的热电子能量分布遵从玻尔兹曼函数

热电子平均能量是0.16eV左右

这个值和能量转换效率测量结果相一致。

Abstract

Visible and infrared d.c.e.l.emission has been observed in thin films of ZnS:Cu:Nd:Cl prepared by co-evaporation in vacuum.The lifetimes of the excited states of the Nd

ion and the emission intensities at various wavelengths have been studied as a function of temperature and applied voltage.The energy distribution of the conduction band hot electrons taking part in the electroluminescence excitation process has been shown to follow a Boltzmann function and the mean energy of the hot electrons has been found to be 0.16 eV

a value which is consistent with the measured energy conversion efficienicies.

关键词

Keywords

references

浏览量

下载量

CSCD

文章被引用时，请邮件提醒。

提交

工具集

关联资源

暂无数据