Chen Liang-yao, Qian You-hua. ELECCTROLYTE ELECTROREFLECTANCE (EER) MEASUREMENTS FOR COMPOSITION OF Ⅲ-Ⅴ GROUP COMPOUND SEMICON-DUCTOR ALLOYS[J]. Chinese Journal of Luminescence, 1982,3(1): 69-76
Chen Liang-yao, Qian You-hua. ELECCTROLYTE ELECTROREFLECTANCE (EER) MEASUREMENTS FOR COMPOSITION OF Ⅲ-Ⅴ GROUP COMPOUND SEMICON-DUCTOR ALLOYS[J]. Chinese Journal of Luminescence, 1982,3(1): 69-76DOI:
The composition parameter x dependences of electrolyte electro-reflectance (EER) spectra were observed on a series of Ⅲ-Ⅴ group compound semiconductor alloy samples of GaAs
1-
x
p
x
and Al
x
Ca
1-
x
As."Three-point adjusting method"was adopted in the estimation-of critical point energies and its allied spin-orbit splittings E
g
o
△
o
E
g
1
△
1
. From the values of E
g
o
compositions of all GaAs
1-
x
p
x
samples were obtained according to a formula given in Ref [9]. Then
empirical formula of parabolic type for all of the energies [E
g
o
+△
o
](x)
E
g
1
(x)
[E
g
1
+△
1
](x) were achieved by a best fit procedure
In the circumstances of GaP(x=1)
a value of △
1
about 0.16eV was definitely measured. deviating appreciably from"2/3 rule" for the ratio of △
1
:△
0
.The necessity of applying a quabra-tic term correction to the linear type assumption of E
g
o
(x)
conventionally used in photovoltaic determination of the semiconductor alloy compositions