Liu Tong-yu, Gao Han-jiang, Tao Shi-wen, Liu Shi-ti, Zhao Guo-zhang, Wang Shu-qin, Wu Li-ji, Zhong Guo-zhu. STUDY OF THE RELATION BETWEEN ELECTROLUMINESCENT EFFICIENCY AND DISTRIBUTION OF ELECTRIC FIELD STRENGTH IN THE ZnS:Cu, Er, Cl DC THIN FILM EL DEVICES[J]. Chinese Journal of Luminescence, 1981,2(3): 24-30
Liu Tong-yu, Gao Han-jiang, Tao Shi-wen, Liu Shi-ti, Zhao Guo-zhang, Wang Shu-qin, Wu Li-ji, Zhong Guo-zhu. STUDY OF THE RELATION BETWEEN ELECTROLUMINESCENT EFFICIENCY AND DISTRIBUTION OF ELECTRIC FIELD STRENGTH IN THE ZnS:Cu, Er, Cl DC THIN FILM EL DEVICES[J]. Chinese Journal of Luminescence, 1981,2(3): 24-30DOI:
it is observed that distribution of electric field strength in thickness direction is inhomogenous in ZnS:Cu
Er
Cl DC thin film EL devices. Three high field regions and two low field regions are measured.We have measured the EL efficiencies in these regions and found that EL efficiency is higher in the high field region and lower in the low field region.The reason for formation of high field regions and relation between EL efficiency and electric field strength are discussed in this Paper.