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Evaluation of Beam Quality M2 for 976 nm Wide Stripe High Power Semiconductor Laser
Device Fabrication and Physics | 更新时间:2020-08-12
    • Evaluation of Beam Quality M2 for 976 nm Wide Stripe High Power Semiconductor Laser

    • Chinese Journal of Luminescence   Vol. 40, Issue 2, Pages: 196-203(2019)
    • DOI:10.3788/fgxb20194002.0196    

      CLC: TN248.4
    • Received:17 July 2018

      Revised:16 October 2018

      Published Online:15 October 2018

      Published:05 February 2019

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  • YAN Hong-yu, GAO Xin, SONG Jian etc. Evaluation of Beam Quality <em>M</em><sup>2</sup> for 976 nm Wide Stripe High Power Semiconductor Laser[J]. Chinese Journal of Luminescence, 2019,40(2): 196-203 DOI: 10.3788/fgxb20194002.0196.

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