Low-temperature Thermoluminescence of (Lu,Y)2SiO5: Ce3+ and SrSO4: Dy3+ and Their Measurement Instruments

TANG Hua-ming; TANG Qiang; MAO Ri-hua; XIE Jian-cai

doi:10.3788/fgxb20183912.1807

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Low-temperature Thermoluminescence of (Lu,Y)₂SiO₅: Ce³⁺ and SrSO₄: Dy³⁺ and Their Measurement Instruments

更新时间：2020-08-12

- Low-temperature Thermoluminescence of (Lu,Y)₂SiO₅: Ce³⁺ and SrSO₄: Dy³⁺ and Their Measurement Instruments
- Chinese Journal of Luminescence Vol. 39, Issue 12, Pages: 1807-1813(2018)
- 作者机构：
  
  1. 中山大学物理学院广州,510275
  2. 中国科学院上海硅酸盐所上海,201800
  3. 广州瑞迪爱生科技有限公司广州,510653
- 作者简介：
- 基金信息：
  
  Supported by National Natural Science Foundation of China(11375278)
- DOI：10.3788/fgxb20183912.1807
  CLC： O482.31
- Received：22 February 2018，
  
  Revised：15 April 2018，
  
  Published：05 December 2018
- 稿件说明：
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唐桦明, 唐强, 毛日华等. (Lu,Y)2SiO5∶Ce3+与SrSO4∶Dy3+材料低温热释光及其测试仪器的研究[J]. 发光学报, 2018,39(12): 1807-1813

TANG Hua-ming, TANG Qiang, MAO Ri-hua etc. Low-temperature Thermoluminescence of (Lu,Y)2SiO5: Ce3+ and SrSO4: Dy3+ and Their Measurement Instruments[J]. Chinese Journal of Luminescence, 2018,39(12): 1807-1813
唐桦明, 唐强, 毛日华等. (Lu,Y)2SiO5∶Ce3+与SrSO4∶Dy3+材料低温热释光及其测试仪器的研究[J]. 发光学报, 2018,39(12): 1807-1813 DOI： 10.3788/fgxb20183912.1807.

TANG Hua-ming, TANG Qiang, MAO Ri-hua etc. Low-temperature Thermoluminescence of (Lu,Y)2SiO5: Ce3+ and SrSO4: Dy3+ and Their Measurement Instruments[J]. Chinese Journal of Luminescence, 2018,39(12): 1807-1813 DOI： 10.3788/fgxb20183912.1807.

摘要

为了分析材料在低温下的陷阱能级，获得更多有关缺陷结构的信息，研制了一套由STM32微控制器为核心的低温热释光发光谱测量系统。设计了低温样品室，采用液氮冷却样品；STM32通过控制加热电流，实现样品以恒定速率升温，从而获得低温热释光发光曲线或三维热释光谱。温度测量范围为85~400 K，升温速率范围为0.1~10 K/s。设计了由STM32控制X射线及紫外光源的驱动电路，用于样品的激发。采用高灵敏度CCD实现对三维热释光谱的测量，采用单光子计数器获取二维热释光发光曲线。利用该系统测试了（Lu，Y）

SiO

:Ce

（LYSO:Ce

）单晶闪烁体与SrSO

:Dy

粉末样品的热释光谱及辐射发光光谱。观察到LYSO:Ce

在108，200，380 K左右的热释光峰，发光波长位于390~450 nm之间，是明显的宽带峰。在低温下由于基质的自陷激子（STE）发射所形成的发射峰在166 K时发生猝灭。在309 K时，Ce

发射峰展宽为单一发射峰；SrSO

:Dy

发光峰温度为178，385 K，发光波长由Dy

离子的能级跃迁决定，在480，575，660，750 nm处呈现窄带发光峰。结果表明，系统人机交互界面友好，实验数据可靠，智能化程度高，操作简单。

Abstract

To analyze the trap level at low temperature and obtain more information about the defect structure of materials

a low-temperature thermoluminescence(TL) spectrum measurement system based STM32 micro-controller was developed. Low-temperature sample chamber was designed and the samples were cooled by liquid nitrogen. The heating current was controlled by STM32 so that TL glow curves or three-dimensional(3D) TL spectra were obtained at a constant heating rate. The system has a high-precision temperature range of 85-400 K and the heating rate ranges from 0.1-10 K/s. The drive circuit of X-ray and ultraviolet light controlled by STM32 are designed for sample excitation. A CCD and a PMT are installed in the system to obtain two-dimensional(2D) TL glow curves and 3D TL spectrum respectively. In this paper

the system is used to test the TL and radioluminescence(RL) of (Lu

SiO

:Ce

(LYSO:Ce

) scintillator and SrSO

:Dy

. The luminescence around 108

200

380 K is observed in LYSO:Ce

. The emission band is between 390 and 450 nm

which is a clear broad-band spectra. The emission peak due to the self-trapped excitons(STE) from host at low-temperature quenches above 166 K. The emission peaks of Ce

broaden into a single peak at 309 K

the emission peaks of SrSO

:Dy

are at 178

385 K and the wavelength are 480

575

660

750 nm due to the energy transitions of Dy

they are narrow-band spectra. The system can provide some merits

such as friendly interface

credible experimental data

higher intelligentization and simple operations.

关键词

Keywords

references

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