您当前的位置:
首页 >
文章列表页 >
Evaluation of Packaging Induced Stress of Semiconductor Laser Bar
更新时间:2020-08-12
    • Evaluation of Packaging Induced Stress of Semiconductor Laser Bar

    • Chinese Journal of Luminescence   Vol. 39, Issue 3, Pages: 343-348(2018)
    • DOI:10.3788/fgxb20183903.0343    

      CLC: TN248.4
    • Received:05 July 2017

      Revised:19 August 2017

      Published Online:28 August 2017

      Published:05 March 2018

    移动端阅览

  • ZHANG Zhe-ming, BO Bao-xue, ZHANG Xiao-lei etc. Evaluation of Packaging Induced Stress of Semiconductor Laser Bar[J]. Chinese Journal of Luminescence, 2018,39(3): 343-348 DOI: 10.3788/fgxb20183903.0343.

  •  
  •  

0

Views

445

下载量

1

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Reflectance and Degree of Polarization in Loss Single-negative Bilayer

Related Author

KANG Yong-qiang

Related Institution

Institute of Solid State Physics, Shanxi Datong University
0