Mechanism of Spectrum Response Degradation in CCD's Exposed to &gamma;-ray and Proton

WEN Lin; LI Yu-dong; GUO Qi; WANG Chao-min

doi:10.3788/fgxb20183902.0244

您当前的位置：

首页 >

文章列表页 >

Mechanism of Spectrum Response Degradation in CCD's Exposed to γ-ray and Proton

更新时间：2020-08-12

- Mechanism of Spectrum Response Degradation in CCD's Exposed to γ-ray and Proton
- Chinese Journal of Luminescence Vol. 39, Issue 2, Pages: 244-250(2018)
- 作者机构：
  
  1. 中国科学院新疆理化技术研究所, 中国科学院特殊环境功能材料与器件重点实验室, 新疆电子信息材料与器件重点实验室,新疆乌鲁木齐,830011
  2. 重庆光电技术研究所, 重庆 400060
- 作者简介：
- 基金信息：
  
  Supported by Youth Science and Technology Innovation Talents Training Project of Xin
- DOI：10.3788/fgxb20183902.0244
  CLC： TP211.6;O472.8
- Received：12 May 2017，
  
  Revised：17 June 2017，
  
  Published：05 February 2018
- 稿件说明：
移动端阅览
文林, 李豫东, 郭旗等. γ射线及质子辐照导致CCD光谱响应退化的机制[J]. 发光学报, 2018,39(2): 244-250

WEN Lin, LI Yu-dong, GUO Qi etc. Mechanism of Spectrum Response Degradation in CCD's Exposed to γ-ray and Proton[J]. Chinese Journal of Luminescence, 2018,39(2): 244-250
文林, 李豫东, 郭旗等. γ射线及质子辐照导致CCD光谱响应退化的机制[J]. 发光学报, 2018,39(2): 244-250 DOI： 10.3788/fgxb20183902.0244.

WEN Lin, LI Yu-dong, GUO Qi etc. Mechanism of Spectrum Response Degradation in CCD's Exposed to γ-ray and Proton[J]. Chinese Journal of Luminescence, 2018,39(2): 244-250 DOI： 10.3788/fgxb20183902.0244.

摘要

光谱响应是表征CCD性能的重要参数。为了研究辐射环境对CCD光谱响应产生影响的规律及物理机制，开展了不同粒子辐照实验，对CCD光谱响应曲线的退化形式及典型波长下CCD光响应的退化情况进行了分析。辐射效应对CCD光谱响应的影响可以分为电离总剂量效应和位移效应导致的退化，本文从这两种辐射效应出发，采用

Co-射线及质子两种辐照条件，研究了CCD光谱响应的退化规律。针对460 nm（蓝光）和700 nm（红光）等典型CCD光响应波长，从辐射效应导致的损伤缺陷方面分析了CCD光谱响应退化的物理机制。研究发现，在

Co-射线辐照时CCD光谱响应曲线变化是由于暗信号增加导致的，而质子辐照导致CCD对700 nm波长的光响应退化明显大于460 nm波长的光响应，且10 MeV质子导致的损伤比3 MeV质子更明显，表明位移损伤缺陷易导致CCD光谱响应退化。结果表明，电离总剂量效应主要导致CCD光谱响应整体变化，而位移效应则导致不同波长光的响应差异增大。

Abstract

Spectral response is one of the important parameters of CCD. In order to study the effects and physical mechanism of spectral response of CCD being affected by radiation environmental

the different particles irradiation tests are done

also the degradation form of CCDs' spectral response and degradation of CCDs' light response on typical wavelength are investigated. The decays of spectral response in CCD exposed to radiation environment consist of total ionizing dose effects and displacement damage effects. This paper investigated the degradation law and physics mechanism of spectral response in CCD irradiated by

Co- and proton. In view of the typical CCD optical response wavelength of 460 nm (blue light) and 700 nm (red light)

the physical mechanism of the degradation of CCD spectral response was analyzed from the radiation induced damage defects. The results suggest that the CCDs' spectral response curve change induced by

Co-gamma ray is due to the dark signal increases. The CCDs' spectral response degradation induced by proton is significantly higher at 700 nm wavelength light response than at 460 nm. The degradation is more obvious at 10 MeV proton than 3 MeV proton. So it is clearly that displacement damage defects easily lead to CCD spectral response degradation. The results indicate that the total ionizing dose effects inducing a global degradation of spectrum response

while displacement damage inducing the contrast of spectrum response on different wave length significantly.

关键词

Keywords

references

GRANT C E, BAUTZ M W, KISSEL S M, et al.. Long-term trends in radiation damage of chandra X-ray CCDs[C]. Optics & Photonics 2005. International Society for Optics and Photonics, San Diego, USA, 2005:58980Q-1-11.

SEABROKE G, HOLLAND A. Modelling radiation damage to ESA's Gaia satellite CCDs[J]. SPIE, 2008, 7021(3):70211P-1-12.

PROD'HOMME T, HOLL B, LINDEGREN L, et al.. The impact of CCD radiation damage on Gaia astrometry-Ⅱ. Effect of image location errors on the astrometric solution[J]. Monthly Notices Royal Astronom. Soc., 2012, 422(4):2786-2807.

VAN DYKE D W. Effects of CTE degradation on cycle 18 observations with the STIS CCD[S]. Instrument Science Report STIS 2011-02(v2), 2011.

翁雪涛, 唐遵烈, 周建勇, 等. 10241024全帧CCD器件[J]. 半导体光电, 2011, 32(4):459-461. WENG X T, TANG Z L, ZHOU J Y, et al.. 10241024 full frame CCD devices[J]. Semicond. Optoelectron., 2011, 32(4):459-461. (in Chinese)

HOPKINSON G R, SHORT A, VETEL C, et al.. Radiation effects on astrometric CCDs at low operating temperatures[J]. IEEE Trans. Nuc. Sci., 2005, 52(6):2664-2671.

SROUR J R, LO D H. Universal damage factor for radiation-induced dark current in silicon devices[J]. IEEE Trans. Nuc. Sci., 2000, 47(6):2451-2459.

HOPKINS I H, HOPKINSON G R, JOHLANDER B. Proton-induced charge transfer degradation in CCDs for near-room temperature applications[J]. IEEE Trans. Nuc. Sci., 1994, 41(6):1984-1991.

WANG Z, MA W, HUANG S, et al.. Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors[J]. AIP Adv., 2016, 6(3):077108.

钟玉杰, 周玉红, 雷仁方, 等. 辐照对10241152可见光CCD的影响研究[J]. 半导体光电, 2010, 31(6):846-848. ZHONG Y J, ZHOU Y H, LEI R F, et al.. Effects of irradiation on 10241152 CCD[J]. Semicond. Optoelectron., 2010, 31(6):846-848. (in Chinese)

ANDERSON J, BEDIN L R. An empirical pixel-based correction for imperfect CTE. I.HST's advanced camera for surveys[J]. Public. Astronom. Soc. Pacific, 2010, 122(895):1035-1064.

WANG Z, CHEN W, HUANG S, et al.. Degradation of saturation output of the COTS array charge-coupled devices induced by total dose radiation damage[J]. Nuc. Instrum. Methods Phys. Res., 2014, 751(6):31-35.

HOU R, ZHAO S, YAO Z, et al.. Analysis of charge transfer inefficiency of CCD equipment under proton radiation[C]. International Conference on Electronics and Optoelectronics, IEEE, Taiyuan, China, 2011:V2-272-V2-274.

KONRADI A, HARDY A C, ATWELL W. Radiation Environment Models and The Atmospheric Cutoff[M]. Paris:Rousseau on Education, 2015:618-624.

HALL D J, BUSH N, MURRAY N, et al.. Challenges in photon-starved space astronomy in a harsh radiation environment using CCDs[C]. Optics for EUV, X-Ray, and Gamma-Ray Astronomy Ⅶ, Montreal, Canada, 2015:96020U.

BAGGETT S M, SOSEY M. HST/WFC3:understanding and mitigating radiation damage effects in the CCD detectors[J]. SPIE, 2016, 55(10):99045D.

MARCELOT O, GOIFFON V, RAINE M, et al.. Radiation effects in CCD on CMOS devices:first analysis of TID and DDD effects[J]. IEEE Trans. Nuc. Sci., 2015, 62(6):2965-2970.

VERHOEVE P, PROD'HOMME T, OOSTERBROEK T, et al.. Optical and dark characterization of the PLATO CCD at ESA[J]. SPIE, 2016, 9915:99150Z.

NETZER R, AVERY K, KEMP W, et al.. Total ionizing dose effects on commercial electronics for cube sats in low earth orbits[C]. Radiation Effects Data Workshop, IEEE, Boston, USA, 2015:1-7.

AHMED N, LU G N, ROY F. Total ionizing dose effects on quantum efficiency and dark current of cmos image sensors with deep-trench-isolation[J]. Sens. Lett., 2015, 13(7):539-542.

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Effect of Alkali Solution Modifying on The Spectral Response of Silicon Nanowire Arrays Solar Cell

Related Author

JIANG Yu-rong

QING Rui-ping

BIAN Chang-xian

HUANG Jing

HU Xiao-feng

YANG Hai-gang

MA Heng

CHANG Fang-gao

Related Institution

College of Physics and Information Engineering, Henan Normal University

Henan Key Laboratory of Photovoltaic Materials

Fifth Professional Technical Secondary Shool of Xinxiang City of Henan Province

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China Postal code：130033
Tel：0431-86176862 Email：fgxbt@126.com
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰

Mechanism of Spectrum Response Degradation in CCD's Exposed to γ-ray and Proton

DOI：10.3788/fgxb20183902.0244

摘要

Abstract

关键词

Keywords

references