Degradation Analysis of Mid-power GaN-based LEDs with Different Package Materials

FU Jia-iia; CAO Hai-cheng; ZHAO Li-xia; WANG Jun-xi; LI Jin-min

doi:10.3788/fgxb20163710.1230

您当前的位置：

首页 >

文章列表页 >

Degradation Analysis of Mid-power GaN-based LEDs with Different Package Materials

更新时间：2020-08-12

- Degradation Analysis of Mid-power GaN-based LEDs with Different Package Materials
- Chinese Journal of Luminescence Vol. 37, Issue 10, Pages: 1230-1236(2016)
- 作者机构：
  
  中国科学院半导体研究所半导体照明研发中心, 北京 100083
- 作者简介：
- 基金信息：
  
  "863"
- DOI：10.3788/fgxb20163710.1230
  CLC： TN383+.1
- Received：28 April 2016，
  
  Revised：22 May 2016，
  
  Published：05 October 2016
- 稿件说明：
移动端阅览
符佳佳, 曹海城, 赵丽霞等. 不同封装材料的中功率GaN基LED器件老化分析[J]. 发光学报, 2016,37(10): 1230-1236

FU Jia-iia, CAO Hai-cheng, ZHAO Li-xia etc. Degradation Analysis of Mid-power GaN-based LEDs with Different Package Materials[J]. Chinese Journal of Luminescence, 2016,37(10): 1230-1236
符佳佳, 曹海城, 赵丽霞等. 不同封装材料的中功率GaN基LED器件老化分析[J]. 发光学报, 2016,37(10): 1230-1236 DOI： 10.3788/fgxb20163710.1230.

FU Jia-iia, CAO Hai-cheng, ZHAO Li-xia etc. Degradation Analysis of Mid-power GaN-based LEDs with Different Package Materials[J]. Chinese Journal of Luminescence, 2016,37(10): 1230-1236 DOI： 10.3788/fgxb20163710.1230.

摘要

针对中功率蓝光及相应的白光LED器件进行加速老化实验，并具体分析了器件中硅胶和绿红混合荧光粉等封装材料对老化行为的影响和失效机理。在测试器件的光电老化行为之后，利用反射光谱和飞行时间二次离子质谱对失效器件进行了结构分析。结果表明，温度和湿度对蓝光和白光器件老化行为具有不同的影响。对于中功率蓝光LED而言，其光衰的主要原因是由于S、Cl等元素的引入及氧化等因素引起的黄化导致了透明硅胶反射率的下降。而对于绿红混合荧光粉组成的中功率白光LED来说，其光衰和色漂问题主要归结于在高温特别是高湿环境下工作，器件中荧光粉和硅胶等封装材料发生了一些化学反应，使荧光粉发生分解，并引起了荧光转换效率的下降。

Abstract

Highly stress tests were carried out for mid-power GaN-based LEDs encapsulated with silicone and green/red mixed phosphors. Except for the optical and electrical measurement

the reflection spectroscopy and time of flight-secondary ion mass spectrometry (TOF-SIMS) were also used to investigate the failure mechanism. Our results show that the high temperature and humidity play an important role in determining the failure mode for mid-power blue and white LEDs. The decrease of the blue emission is related to the degradation of the transparent silicone and the reflectivity by the oxidation and the contamination of sulfide and chlorine. While the dissolution of the phosphors in white LEDs will lead to the decrease of the conversion efficiency and deteriorate the photometric and colorimetric properties of mid-power white LEDs.

关键词

Keywords

references

HUANG J L, GOLUBOVI?D S, KOH S, et al.. Degradation mechanisms of mid-power white-light LEDs under high-temperature-humidity conditions [J]. IEEE Trans. Dev. Mater. Reliab., 2015, 15(2):220-228.

BUFFOLO M, DE SANTI C, MENEGHINI M, et al.. Long-term degradation mechanisms of mid-power LEDs for lighting applications [J]. Microelectron. Reliab., 2015, 55(9-10):1754-1758.

BING Q C, CORNELISSEN H J, HU N C. Dual phosphors-converted white LEDs modeling by using near-field chromatic luminance data [J]. SPIE, 2014, 9003:900304-1-10.

TREVISANELLO L, MENEGHINI M, MURA G, et al.. Accelerated life test of high brightness light emitting diodes [J]. IEEE Trans. Dev. Mater. Reliab., 2008, 8(2):304-311.

MENEGHESSO G, LEVADA S, ZANONI E, et al.. Reliability of visible GaN LEDs in plastic package [J]. Microelectron. Reliab., 2003, 43(9-11):1737-1742.

MCCLUSKEY P, MENSAH K, O'CONNOR C, et al.. Reliable use of commercial technology in high temperature environments [J]. Microelectron. Reliab., 2000, 40(8-10):1671-1678.

FU J J, ZHAO L X, CAO H C, et al.. Degradation behavior of GaN-based LEDs encapsulated with different phosphors [C]. Proceedings of The 2014 11th China International Forum on Solid State Lighting, Guangzhou, China, 2014:111-113.

NARENDRAN N, GU Y, FREYSSINIER J P, et al.. Solid-state lighting: failure analysis of white LEDs [J]. J. Cryst. Growth, 2004, 268(3-4):449-456.

TORIKAI A, HASEGAWA H. Accelerated photodegradation of poly(vinyl chloride) [J]. Polym. Degrad. Stab., 1999, 63(3):441-445.

DOWN J L. The yellowing of epoxy resin adhesives: report on high-intensity light aging [J]. Stud. Conserv., 1986, 31(4):159-170.

XIE R J, HIROSAKI N. Silicon-based oxynitride and nitride phosphors for white LEDsa review [J]. Sci. Technol. Adv. Mater., 2007, 8(7-8):588-600.

XIE R J, HIROSAKI N, KIMURA N, et al.. 2-phosphor-converted white light-emitting diodes using oxynitride/nitride phosphors [J]. Appl. Phys. Lett., 2007, 90(19):191101-1-3.

ARIK M, SETLUR A, WEAVER S, et al.. Chip to system levels thermal needs and alternative thermal technologies for high brightness LEDS [J]. J. Electron. Packag., 2007, 129(3):328-338.

YANG C C, LIN C M, CHEN Y J, et al.. Highly stable three-band white light from an InGaN-based blue light-emitting diode chip precoated with (oxy)nitride green/red phosphors [J]. Appl. Phys. Lett., 2007, 90(12):123503.

WU H, ZHANG X M, GUO G F, et al.. Three-band white light from InGaN-based blue LED chip precoated with green/red phosphors [J]. IEEE Photon. Technol. Lett., 2005, 17(6):1160-1162.

SHEU J K, CHANG S J, KUO C H, et al.. White-light emission from near UV InGaN-GaN LED chip precoated with blue/green/red phosphors [J]. IEEE Photon. Technol. Lett., 2003, 15(1):18-20.

LIU L L, LING M J, YANG J F, et al.. Efficiency degradation behaviors of current/thermal co-stressed GaN-based blue light emitting diodes with vertical-structure [J]. J. Appl. Phys., 2012, 111(9):093110-1-9.

SHAAT S K K, SWART H C, NTWAEABORWA O M. Investigation of luminescent properties of Ca0.3Sr0.7Al2O4: Tb3+, Eu3+ excited using different excitation sources [J]. J. Electron Spectrosc. Relat. Phenom., 2014, 197:72-79.

Views

128

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

No data

Related Author

No data

Related Institution

No data

AI问答

Address：No.3888 Dong Nanhu Road, Changchun, Jilin, China Postal code：130033
Tel：0431-86176862 Email：fgxbt@126.com
Technical support is provided by Beijing Founder electronics co., LTD 吉ICP备11002662号-17 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰