LEI Jun, GUO Wei-ling, LI Song-yu etc. Aging Experiments of High Voltage Power White LEDs Under Different Stresses[J]. Chinese Journal of Luminescence, 2016,37(7): 804-808
LEI Jun, GUO Wei-ling, LI Song-yu etc. Aging Experiments of High Voltage Power White LEDs Under Different Stresses[J]. Chinese Journal of Luminescence, 2016,37(7): 804-808 DOI: 10.3788/fgxb20163707.0804.
Aging Experiments of High Voltage Power White LEDs Under Different Stresses
The stress accelerated aging test and analysis are the most efficient and effective way to analysis the reliability of the devices. In this paper
the same 6 V LED modules were divided into two groups for aging. 180 mA stress current and 85℃ high temperature were applied for one group
and 180 mA stress current and 85℃/85%RH moisture condition for another. During the aging time
the optical and electrical characteristics of the LEDs were measured and analyzed. The experimental results show that the degradation rate of the samples which under high temperature and high current stress is 3.4%-0.9%
and the degradation rate of the samples which under high humidity
high temperature and high current stress is 25.4%-27.8%. The degradation of LEDs under high temperature and high humidity condition is more serious than that under high temperature. So it is strong evidence that the humidity badly affects the reliability of LEDs. The failure reasons include the degradation of the phosphor and the Ohmic contact in the devices.
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references
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