Protection System for Optoelectronic Sensors Against Laser Radiation Based on Light Modulation of DMD

TONG Yang; XU Xi-ping

doi:10.3788/fgxb20153611.1325

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Protection System for Optoelectronic Sensors Against Laser Radiation Based on Light Modulation of DMD

更新时间：2020-08-12

- Protection System for Optoelectronic Sensors Against Laser Radiation Based on Light Modulation of DMD
- Chinese Journal of Luminescence Vol. 36, Issue 11, Pages: 1325-1329(2015)
- 作者机构：
  
  长春理工大学光电工程学院,吉林长春,130022
- 作者简介：
- 基金信息：
- DOI：10.3788/fgxb20153611.1325
  CLC： TN216
- Received：13 August 2015，
  
  Revised：19 September 2015，
  
  Published：10 November 2015
- 稿件说明：
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佟洋, 徐熙平,. 基于数字微镜阵列光调制的激光防护系统[J]. 发光学报, 2015,36(11): 1325-1329

TONG Yang, XU Xi-ping,. Protection System for Optoelectronic Sensors Against Laser Radiation Based on Light Modulation of DMD[J]. Chinese Journal of Luminescence, 2015,36(11): 1325-1329
佟洋, 徐熙平,. 基于数字微镜阵列光调制的激光防护系统[J]. 发光学报, 2015,36(11): 1325-1329 DOI： 10.3788/fgxb20153611.1325.

TONG Yang, XU Xi-ping,. Protection System for Optoelectronic Sensors Against Laser Radiation Based on Light Modulation of DMD[J]. Chinese Journal of Luminescence, 2015,36(11): 1325-1329 DOI： 10.3788/fgxb20153611.1325.

摘要

提出一种基于数字微镜阵列(DMD)的激光防护系统设计方案

利用DMD的光调制作用减少强激光对光电成像设备的损坏.详细介绍了系统的工作原理、DMD及CCD的选型、投影光路和光学转换系统的设计

运用相移莫尔法进行了图像像素的调校.模拟实验结果显示

该系统可在不同光斑半径和光强的条件下成功识别激光光斑中心点的像素坐标和半径

实现对光斑对应区域的微反射镜控制

激光光强可衰减70%以上.

Abstract

A design scheme of laser protection system based on digital micro-mirror device (DMD) was proposed to reduce the damage of intense laser to optoelectronic imaging equipment. The working principle of the system

the model selection of DMD and CCD

the projection optical path and the design of optical conversion system were introduced in detail. The image pixels were tuned by using the phase-shifting Mohr method. The simulation results show that the system can successfully identify pixel coordinates and radiuses of the laser spot center points in different spot radiuses and light intensities

and achieve micro-mirror control of the corresponding regions of spots. The laser light intensity can be attenuated by over 70%.

关键词

Keywords

references

Meng X F, Lu C H, Ni Y R, et al. Application and protection of laser technology [J]. Infrared Laser Eng.(红外与激光工程), 2005, 34(2):136-141 (in Chinese).

Shen Z F. Preparation of specific refractive index material and optical thin films [J]. Chin. Opt.(中国光学), 2013, 6(6):900-905 (in Chinese).

Chen M, Ma S J, Li C F, et al. Eye-protection glasses against YAG laser disservice based on the bandgap reflection of one-dimensional photonic crystal [J]. Chin. J. Lumin.(发光学报), 2004, 25(3):325-328 (in Chinese).

Shi P, Fu X H, Sun Y, et al. Design and fabrication of double wavelength laser protective infrared antireflection coatings [J]. Chin. J. Lasers (中国激光), 2011, 38(4):182-186 (in Chinese).

Chen Z H, Xiao S, He J, et al. Ultrafast optical nonlinearities in GaAs at telecommunication wavelengths [J]. Chin. J. Lumin.(发光学报), 2015, 36(8):969-975 (in Chinese).

Qu S L, Du C M, Song Y L, et al. Nonlinear refraction and optical limiting in the nanocomposite based on C60 structured system with gold nanoparticles [J]. Chin. J. Lasers (中国激光), 2002, 29(4):335-338 (in Chinese).

Song H L, Yan L H, Si J H, et al. Optical limiter for ultrashort laser pulses based on ultrafast optical Kerr effect [J]. Chin. J. Lasers (中国激光), 2015, 42(2):0217002-1-6 (in Chinese).

Soon B Y, Haus J, Scalora M, et al. One-dimensional photonic crystal optical limiter [J]. Opt. Express, 2003, 11(17):2007-2018.

Venkatram N, Kumar R S S, Rao D N. Nonlinear absorption and scattering properties of cadmium sulphide nanocrystals with its application as a potential optical limiter [J]. J. Appl. Phys., 2006, 100(7):074309-1-7.

Huang Y, Siganakis G, Moharam M G, et al. Broadband optical limiter based on nonlinear photoinduced anisotropy in bacteriorhodopsin film [J]. Appl. Phys. Lett., 2004, 85(22):5445-5447.

Saldner H O, Huntley J M. Profilometry using temporal phase unwrapping and a spatial light modulator-based fringe projector [J]. Opt. Eng., 1997, 36(2):610-615.

Kakunai S, Sakamoto T, Iwata K. Profile measurement taken with liquid-crystal gratings [J]. Appl. Opt., 1999, 38(13):2824-2828.

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