您当前的位置:
首页 >
文章列表页 >
Reliability Assessment of LED Lamp Based on Acceleration Degradation Test
更新时间:2020-08-12
    • Reliability Assessment of LED Lamp Based on Acceleration Degradation Test

    • Chinese Journal of Luminescence   Vol. 35, Issue 9, Pages: 1143-1151(2014)
    • DOI:10.3788/fgxb20143509.1143    

      CLC: TN312.8;TN364
    • Received:04 June 2014

      Revised:23 June 2014

      Published:03 September 2014

    移动端阅览

  • XIAO Cheng-di, LIU Chun-jun, LIU Wei-dong etc. Reliability Assessment of LED Lamp Based on Acceleration Degradation Test[J]. Chinese Journal of Luminescence, 2014,35(9): 1143-1151 DOI: 10.3788/fgxb20143509.1143.

  •  
  •  

0

Views

432

下载量

9

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Photoluminescence and Multifunctional Applications of NaGdMgTeO6∶Eu3+ Phosphors
Preparation of New Single Component Solid Carbon Dots for White LED with High Color Rendering Index
AlGaN Based Deep Ultraviolet LED for Inactivating Coxsackie Virus
Regulating Near-infrared Luminescence of ZnGa2O4∶Cr3+ via F/O Anion Substitution
Recent Progress on Bi3+-doped Luminescent Material

Related Author

LIU Fangfang
DAI Zhengmang
ZHOU Weiwei
LI Rongqing
XIA Zhengrong
WANG Zifeng
YANG Miai
ZHU Haodong

Related Institution

Anhui Engineering Research Center for Photoelectrocatalytic Electrode Materials, School of Electrical Engineering, Huainan Normal University
Huainan No.6 High School
School of Chemistry and Chemical Engineering, Yunnan Normal University
School of Chemistry & Environment, Yunnan Minzu University
Peking University Third Hospital
0