JIA Tian-ying, ZHAN Run-ze, DONG Cheng-yuan. Simulation of The Stability of a-IGZO TFT-OLED Pixel Circuits[J]. Chinese Journal of Luminescence, 2013,34(9): 1240-1244
JIA Tian-ying, ZHAN Run-ze, DONG Cheng-yuan. Simulation of The Stability of a-IGZO TFT-OLED Pixel Circuits[J]. Chinese Journal of Luminescence, 2013,34(9): 1240-1244 DOI: 10.3788/fgxb20133409.1240.
Simulation of The Stability of a-IGZO TFT-OLED Pixel Circuits
Amorphous In-Ga-Zn-O thin film transistors (a-IGZO TFTs) have potentials to be used in pixel circuits of active matrix organic light emitting display (AMOLED). However
bias stress effect still involves a-IGZO TFTs
evidently influencing performance of the corresponding AMOLED pixel circuits. In this study
inverted-staggered a-IGZO TFT devices were fabricated and measured
following which the corresponding Spice model was created. In addition
the dependence of stress time on threshold voltage (
V
th
) shift was theoretically modeled. By using SPICE simulation tool
we studied the stability properties of a-IGZO TFT-OLED pixel circuits in the forms of 2T1C and 3T1C
which proves there exists somewhat compensation effect on the
V
th
shift in 3T1C pixel circuit. Finally
we discussed and analyzed the way to further improve stability of a-IGZO TFT-OLED pixel circuits.
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references
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Related Institution
School of Physical Science and Electronics, Central South University
School of Physics and Electronics, Central South University
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State Key Laboratory of Luminescent Materials and Devices, South China University of Technology
Laboratory of Excited State Processes, Chinese Academy of Sciences, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences