RUAN Kai-bin, WU Guang-heng, ZHOU Hong, LIU Yin-chun. Structural and Optical Properties of Bi<sub>3.15</sub>Eu<sub>0.85</sub>Ti<sub>3</sub>O<sub>12</sub> Ferroelectric Thin Films[J]. Chinese Journal of Luminescence, 2012,33(7): 754-759
RUAN Kai-bin, WU Guang-heng, ZHOU Hong, LIU Yin-chun. Structural and Optical Properties of Bi<sub>3.15</sub>Eu<sub>0.85</sub>Ti<sub>3</sub>O<sub>12</sub> Ferroelectric Thin Films[J]. Chinese Journal of Luminescence, 2012,33(7): 754-759 DOI: 10.3788/fgxb20123307.0754.
Structural and Optical Properties of Bi3.15Eu0.85Ti3O12 Ferroelectric Thin Films
(BEuT) thin films were prepared on fused silica substrates by using chemical solution deposition technique. The structural and optical properties of thin films were stu-died in this work. XRD results show that BEuT thin films exhibit a polycrystalline bismuth-layered perovskite structure
and the average grain sizes increase with the annealing temperatures
which is consistent with the SEM results. Raman spectra of BEuT samples indicate that Eu
3+
mainly replace Bi
3+
in perovskete layer. In the wavelength of above 500 nm
BEuT thin films exhibit high optical transmittance
and the band gaps of all samples are nearly about 3.69 eV. The emission intensities of BEuT thin films increase with the annealing temperatures
which could be due to the improvement of crystallization for the samples annealed at higher temperature.
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references
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