Influences of ZnO Film Characteristics on ZnO Nanowire Arrays Prepared by Hydrothermal Method

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Influences of ZnO Film Characteristics on ZnO Nanowire Arrays Prepared by Hydrothermal Method

paper | 更新时间：2020-08-12

- Influences of ZnO Film Characteristics on ZnO Nanowire Arrays Prepared by Hydrothermal Method
- Chinese Journal of Luminescence Vol. 33, Issue 5, Pages: 549-552(2012)
- 作者机构：
  
  1. 发光学及应用国家重点实验室中国科学院长春光学精密机械与物理研究所,吉林长春,130033
  2. 中国科学院研究生院北京,100039
  3. 长春理工大学材料科学与工程学院,吉林长春,130022
- 作者简介：
- 基金信息：
  
  973"
- DOI：10.3788/fgxb20123305.0549
  CLC： O484.4
- Received：25 January 2012，
  
  Revised：24 March 2012，
  
  Published Online：10 May 2012，
  
  Published：10 May 2012
- 稿件说明：
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徐志堃, 赵东旭, 孙兰兰, 鄂书林, 张振中, 秦杰明, 申德振. ZnO薄膜的性质对水热生长ZnO纳米线阵列的影响[J]. 发光学报, 2012,(5): 549-552

XU Zhi-kun, ZHAO Dong-xu, SUN Lan-lan, E Shu-lin, ZHANG Zhen-zhong, QIN Jie-ming, SHEN De-zhen. Influences of ZnO Film Characteristics on ZnO Nanowire Arrays Prepared by Hydrothermal Method[J]. Chinese Journal of Luminescence, 2012,(5): 549-552
徐志堃, 赵东旭, 孙兰兰, 鄂书林, 张振中, 秦杰明, 申德振. ZnO薄膜的性质对水热生长ZnO纳米线阵列的影响[J]. 发光学报, 2012,(5): 549-552 DOI： 10.3788/fgxb20123305.0549.

XU Zhi-kun, ZHAO Dong-xu, SUN Lan-lan, E Shu-lin, ZHANG Zhen-zhong, QIN Jie-ming, SHEN De-zhen. Influences of ZnO Film Characteristics on ZnO Nanowire Arrays Prepared by Hydrothermal Method[J]. Chinese Journal of Luminescence, 2012,(5): 549-552 DOI： 10.3788/fgxb20123305.0549.

摘要

用水热法在ZnO薄膜上制备了直径、密度及取向可控的ZnO纳米线阵列。ZnO薄膜是通过原子层沉积(ALD)方法制备并在不同温度下退火处理得到的

退火温度对ZnO薄膜的晶粒尺寸、结晶质量和缺陷性质有很大的影响。而ZnO薄膜的性质对随后生长的ZnO纳米线的直径、密度及取向能起到调节控制的作用。通过扫描电子显微镜(SEM)、X射线衍射(XRD)仪和光致发光(PL)测试对ZnO薄膜和ZnO纳米线进行了表征。最后得到的垂直取向的ZnO纳米线阵列适合在发光二极管和太阳能电池等领域使用。

Abstract

ZnO nanowire arrays with controlled diameter

density and orientation were prepared on the ZnO film coated substrates via hydrothermal method. The ZnO film were fabricated by atomic layer deposition (ALD) method and annealed at different temperatures. The annealing temperature has strong influences on the grain size

crystalline structure and defect property of the ZnO film. The diameter

density and orientation of ZnO nanowires depended on the features of the ZnO film. Field-emission scanning electron microscopy (SEM)

X-ray diffraction (XRD) and photoluminescence (PL) were applied to analyze the ZnO film and ZnO nanowire arrays. The as-prepared vertical aligned ZnO nanowires are highly suitable for use in nanodevices

such as light-emitting diodes and solar cells.

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Keywords

references

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Related Author

XU Zhi-kun

ZHAO Dong-xu

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E Shu-lin

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SHEN De-zhen

SHEN Jian

ZHOU Ming

Related Institution

State Key Laboratory of Luminescence and Applications, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

Graduate University of Chinese Academy of Sciences, Beijing 100039, China

Center for Photon Fabrication Science and Technology, Jiangsu University

College of Physics， Jilin University

School of Materials Science and Engineering， Changchun University of Science and Technology

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