JIANG De-long, FANG Li-feng, NA Yan-xiang, LI Ye, TIAN Jing-quan. Monte-Carlo Simulations on The Stopping and Transmittance Characteristics of Particles in The Ion Barrier Film of Microchannel Plate[J]. Chinese Journal of Luminescence, 2011,32(8): 816-820
JIANG De-long, FANG Li-feng, NA Yan-xiang, LI Ye, TIAN Jing-quan. Monte-Carlo Simulations on The Stopping and Transmittance Characteristics of Particles in The Ion Barrier Film of Microchannel Plate[J]. Chinese Journal of Luminescence, 2011,32(8): 816-820 DOI: 10.3788/fgxb20113208.0816.
Monte-Carlo Simulations on The Stopping and Transmittance Characteristics of Particles in The Ion Barrier Film of Microchannel Plate
In the third-generation low-level-light image tube
a super thinner ion barrier film (IBF) was covered on the input surface of microchannel plate (MCP) to protect the photocathode and prolong the operation life of the image tube. In order to further investigate the properties of IBF
a Monte-Carlo simulation on the stopping and transmission characteristics of particles in Al
2
O
3
and SiO
2
IBFs were conducted. It was found that the dead-voltage was 230~240 V and 220~230 V for Al
2
O
3
and SiO
2
IBF with the thickness of 5 nm
respectively. The number of the back-scattered electron was as high as 19% for the incident electrons with energy of 0.24 keV. For the incident energy of 0.8 keV
the electron transmittance was 87.16% and 88.12%
and the limited thickness of the IBF was 15 nm and 16nm for Al
2
O
3
and SiO
2
film
respectively. For C
+
N
+
and O
+
ions with energy of 0.26 keV
the ion stopping power was 95%~99% for Al
2
O
3
IBF. The Al
2
O
3
IBF showed satisfied electron transmittance and ion stopping power when the thickness of IBF was 5 nm.
关键词
Keywords
references
MJ Iosue, Phoenix A Z. Night vision device and method:U.S., US6198090B1 . 2001.[2] Li Ye, Jiang Delong, Xiang Rong, et al. Technology investigation on SiO2 film for ion-preventive feedback of microchannel plate[J]. Acta Electronica Sinica (电子学报), 2008, 36 (12):2400-2404 (in Chinese) .[3] Timothy W Sinor, Joseph P Estrera. An analysis of electron scattering in thin dielectric films used as ion barriers in generation III image tubes [J]. SPIE, 2003, 4796 :23-32.[4] Jiang Delong, Xiang Rong, Wu Kui, et al. Preparation and characteristics of SiO2 ion-preventive feedback thin film [J]. Chin. J. Lumin. (发光学报), 2008, 29 (6):1096-1100 (in Chinese).[5] Jiang Xinrong. Micro-manufacture Technology [M]. Beijing: Publishing House of Electronics Industry, 1999:161-166 (in Chinese).[6] Jiang Delong, Liu Qingfei, Li Ye, et al. MCP ion barrier film and its stopping function on incident ions[J]. Chin. J. Lumin. (发光学报), 2006, 27 (6):1015-1020 (in Chinese).[7] U Littmark, J F Ziegler. Ranges of energetic ions in matter [J]. Phys. Rev. A, 1981, 23 (1):64-72.