SHEN Si-qing, XU Zhi-bin, MA Qing, XIE Jian-jun, SHI Ying, YUAN Hui, XIONG Wei. Sol-gel Synthesis and Luminescence Properties of Ce:LSO Polycrystalline Films[J]. Chinese Journal of Luminescence, 2011,32(9): 880-884
SHEN Si-qing, XU Zhi-bin, MA Qing, XIE Jian-jun, SHI Ying, YUAN Hui, XIONG Wei. Sol-gel Synthesis and Luminescence Properties of Ce:LSO Polycrystalline Films[J]. Chinese Journal of Luminescence, 2011,32(9): 880-884DOI:
Sol-gel Synthesis and Luminescence Properties of Ce:LSO Polycrystalline Films
利用热重差热分析(TG-DSC)、X射线衍射(XRD)、扫描电镜(SEM)、真空紫外光谱(VUV) 及椭偏(SE) 测试对Ce: Lu
2
SiO
5
薄膜的物相、形貌、发光性质和光学常数进行了表征。结果表明:薄膜样品从900 ℃开始晶化
1 100 ℃时晶化完全。薄膜表面均匀、平整、无裂纹。真空紫外激发光谱中存在较强的基质发射
发射光谱是一个350~500 nm 的宽带谱
宽带中心在400 nm左右。折射率、消光系数分别为1.82~1.94和0.005~0.05
厚度与SEM测试结果相一致。
Abstract
Ce
3+
-doped lutetium oxyorthosilicate (Ce: Lu
2
SiO
5
) films have been fabricated on silicon (111) substrates by Pechini sol-gel method combined with the spin-coating technique. Thermogravimetry-differential scanning calorimetry (TG-DSC) analysis
X-ray diffraction (XRD)
Scanning Electron Microscopy (SEM)
PL (Photoluminescent) measurements under VUV as well as spectroscopic ellipsometry (SE) were used to characterize the resulting films. The results indicate that the Ce: Lu
2
SiO
5
films begin to crystallize at 900 ℃ and are completely crystallized at 1 100 ℃. The phosphor films are uniform
dense and crack-free. The VUV spectra show that the excitation is mainly host excited and the emission spectrum is a broad band centered at about 400 nm. The refractive index
the extinction of coefficient are 1.82~1.94 and 0.005~0.05
respectively
the thickness measured by spectroscopic ellipsometry is similar to that obtained by SEM.
关键词
Keywords
references
Melcher C L, Schweitzer J S. Lutetium orthosilicate single crystal scintillator detector: USA,4958080 . 1990-09-18.[2] Vaneijk C W E, Andriessen J, Dorenbos P, et al. Ce3+ doped inorganic scintillators [J]. Nucl. Instrum. Methods A, 1994, 348 (2-3):546-550.[3] Zorenko Y, Konstankevych I, Globus M, et al. New scintillation detectors based on oxide single crystal films for biological microtomograph [J]. Nucl. Instrum. Methods A, 2003, 505 (1-2):93-96.[4] Lee J K, Muenchausen R E, Lee J S, et al. Structure and optical properties of Lu2SiO5: Ce phosphor thin films [J]. Appl. Phys. Lett., 2006, 89 (10):101905-1-3.[5] Rack P D, Peak J D, Melcher C L, et al. Scanning electron and cathode luminescence imaging of thin film Lu2SiO5: Ce scintillating materials [J]. Appl. Phys. Lett., 2007, 91 (24):244102-1-3.[6] Rack P D, Peak J D, Melcher C L, et al. Scanning electron and cathode luminescence imaging of thin film Lu2SiO5: Ce scintillating materials [J]. Appl. Phys. Lett., 2007, 91 (24):244102-1-3.[7] Mansuy C, Mahiou R, Nedelec J M, et al. A new sol-gel route to (Lu2SiO5) LSO scintillator: powders and thin films [J]. Chem. Mater., 2003, 34 (46):3242-3244.[8] Mansuy C, Tomasella E, Mahiou R, et al. Surface characterization of sol-gel derived scintillating rare-earth doped Lu2SiO5 thin films [J]. J. Phys. Conf. Ser., 2008, 100 (1):012037-1-5.[9] Jia Lingchun, Gu Mu, Liu Xiaolin, et al. Preparation and luminescent properties of Lu2SiO5: Ce transparent thin film [J]. J. Chin. Ceramic. Soc. (硅酸盐学报), 2010, 38 (10):1882-1885 (in Chinese).[10] Pechini M P. Method of preparing lead and alkaline earth titanates and niobates and coating method using the same to form a capacitor: US,3330697 . 1967-07-11.[11] Xie Jianjun, Lin Ting, Shi Ying, et al. Luminescence properties of nano-sized Lu2SiO5: Ce phosphors prepared by sol-gel method [J]. J. Chin. Ceramic. Soc. (硅酸盐学报), 2010, 38 (10):1932-1936 (in Chinese).[12] Ren Guohao, Qin Laishun, Lu Sheng, et al. Scintillation characteristics of lutetium oxyorthosilicate (Lu2SiO5: Ce) crystals doped with cerium ions [J]. Nucl. Instrum. Methods A, 2004, 531 (3):560-565.[13] Shi Chaoshu, Liu Bo, Zhang Guobin, et al. Temperature dependence of luminescence from scintillator LSO:Ce under VUV excitation [J]. J. Electron. Spectrosc. Relat. Phenom., 2005, 144-147:905-908.[14] Liao Naiman, Li wei, Jiang Yadong, et al. Thickness and optical constant determination of hydrogenated amorphous silicon thin film from transmittance spectra of ellipsometer [J]. Acta Physica Sinica (物理学报), 2008, 57 (3):1542-1546 (in Chinese).