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In-situ Monitoring of AlGaAs Growth by Reflectance Anisotropy Spectroscopy in MOCVD
paper | 更新时间:2020-08-12
    • In-situ Monitoring of AlGaAs Growth by Reflectance Anisotropy Spectroscopy in MOCVD

    • Chinese Journal of Luminescence   Vol. 32, Issue 12, Pages: 1297-1302(2011)
    • CLC: O484.1;TN304.2
    • Received:21 July 2011

      Revised:08 October 2011

      Published Online:22 December 2011

      Published:22 December 2011

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  • XU Hua-wei, ZHANG Jin-long, NING Yong-qiang, ZENG Yu-gang, ZHANG Xing. In-situ Monitoring of AlGaAs Growth by Reflectance Anisotropy Spectroscopy in MOCVD[J]. Chinese Journal of Luminescence, 2011,32(12): 1297-1302 DOI:

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WANG Peng-cheng
XU Hua-wei
ZHANG Jin-long
NING Yong-qiang
CHANG Jianhua
LIU Bin
XIE Zili
YAN Yu

Related Institution

State Key Laboratory of Luminescence and Application, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences
Graduate University of Chinese Academy of Sciences
School of Electronics and Information Engineering, Nanjing University of Information Science and Technology
School of Electronic Science and Engineering, Nanjing University
School of Physics and Engineering,Sun Yat-sen University
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