Effect of LiF Buffer Layer Used at Interface between Anode and Organic Layer in Organic Light-emitting Diode
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Effect of LiF Buffer Layer Used at Interface between Anode and Organic Layer in Organic Light-emitting Diode
Chinese Journal of LuminescenceVol. 30, Issue 1, Pages: 55-58(2009)
作者机构:
暨南大学 物理系,广东 广州,510632
作者简介:
基金信息:
DOI:
CLC:TN383.1;TN873.3
Received:25 August 2008,
Revised:02 January 1900,
Published Online:20 February 2009,
Published:20 February 2009
稿件说明:
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WU Chun-hong, ZHANG Jing-lei, LIU Peng-yi, et al. Effect of LiF Buffer Layer Used at Interface between Anode and Organic Layer in Organic Light-emitting Diode[J]. Chinese journal of luminescence, 2009, 30(1): 55-58.
DOI:
WU Chun-hong, ZHANG Jing-lei, LIU Peng-yi, et al. Effect of LiF Buffer Layer Used at Interface between Anode and Organic Layer in Organic Light-emitting Diode[J]. Chinese journal of luminescence, 2009, 30(1): 55-58.DOI:
Effect of LiF Buffer Layer Used at Interface between Anode and Organic Layer in Organic Light-emitting Diode
Tremendous progress has been made in the science and technology of organic light-emitting diode in developing flat panel displays. OLED efficiency and lifetime are the primary issues limiting the widespread commercial use. To solve the problem
finding out novel materials and applying new structure are usual methods. The degradation of the interfaces between electrode and organic layer is also an important factor for the stability. Up to now
different treatment both physical and chemical technique has been used to modify the interface
and also
there is a good choice of inserting a nano-layer into the interface. <br>Organic light-emitting diodes inserted LiF film
which usually is used for cathode modifying layer
between anode and organic layer were fabricated by vapor thermal deposition. The structure of the diode is ITO /LiF /TPD(30 nm)/Alq<sub>3</sub>(40 nm)/Al(100 nm) (TPD:N
N'-diphenyl-N
N'-bis(3-methylphenyl )-1
1' -biphenyl-4
4'-diamine
Alq<sub>3</sub>: tris(8-quinolinolato)- aluminum)
and the thicknesses of the LiF film are 0.5
1.0
1.5 and 2.0 nm detected by INFCON XTM/2 deposition monitor. The insertion of the ultra-thin LiF layer between ITO and organic layer improves the photoelectric characteristics of the diodes directly
which blocks the hole injection and improves the efficiency of the diodes. Firstly
the ITO surface is smoothed after depositing a LiF film and that may reduces the formation of non-emissive traps and block the diffusion of In<sup>+</sup> ion from ITO to organic layer. The efficient recombination of holes and electrons in emissive layer improves the luminance and efficiency. Secondly
the LiF buffer layer can blocks hole injection and improves the properties of the diodes
however
a thicker LiF layer can reduce the characteristic of the diodes and it was necessary to optimize the LiF thickness. Finally
it was found that the luminance and efficiency of the diode are maximized when 1.0 nm LiF hole buffer layer is inserted between ITO and TPD.
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references
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