ZHU Bing-jin, CHEN Ze-xiang, ZHANG Qiang, WANG Xiao-ju, YU Tao. Field Emission Characteristics of LaB<sub>6</sub> Film[J]. Chinese Journal of Luminescence, 2008,29(3): 561-566
ZHU Bing-jin, CHEN Ze-xiang, ZHANG Qiang, WANG Xiao-ju, YU Tao. Field Emission Characteristics of LaB<sub>6</sub> Film[J]. Chinese Journal of Luminescence, 2008,29(3): 561-566DOI:
Vacuum micro-electronics devices based on field emission cathode have become the focus of people around the world because it has lots of advantages such as high-speed electron transmission
low power consumption
high current density
operating without heating and so on. Field emission array (FEA) is the most important part of the vacuum micro-electronics device. In order to improve the performance of the FEA devices
many new structures have been designed and the fabrication of FEA has been optimized constantly. Filmed-array is a novel approach that includes not only the advantages of the array but also the characters of the film materials. It is considered to be an effective method to improve the performance of the devices. Filmed-array is fabricated by coating additional thin films on the tip of prepared spindt arrays. If the film material chosen has low work function
high conductance and reliability
good emission can be gained. The choosing principle of the film materials includes work function
conductance
density and reliability. Being a good thermal emission material
lanthanum hexaboride(LaB
6
) has excellent characteristics and is propitious to the film. The fabrication of LaB
6
-coated silicon spindt field emission arrays is reported in this paper
in which standard semiconductor techniques including oxidation
photolithogragh
dry etching
oxidation sharpening on the n-type silicon were used. In our fabricated silicon spindt arrays
the height is about 1μm. Interval between each silicon spindt is 6 μm
and cutting-edge radius of curvature is about 50 nm
tip-angle is about 56 degrees
the density of arrays is about 10
6
/cm
2
. Then
the LaB
6
film is deposited on the silicon spindt by electron beam evaporation to reduce the work function and enhance the capability of resisting ion bombardment. Film thickness is about 50 nm
the radius of curvature is about 111 nm.The X-ray Diffraction (XRD) analysis results indicates LaB
6
with well crystallization was gained by electron beam evaporation
In interplanar 〈100〉
films make preferred growth.
I-V
characteristics and stability of field emission of silicon array and LaB
6
filmed-arrays have been studied. The results show that silicon array coated by LaB
6
film has good and stable emission characteristics. The total field emission current from the LaB
6
filmed-arrays reached to 125 μA
which is 125 times than pure silicon spindt arrays. The results indicated LaB
6
filmed-arrays is the kind of ideal field emission arrays.