SUN Li-jie, ZHONG Sheng, ZHANG Wei-ying, WANG Zheng, LIN Bi-xia, FU Zhu-xi. Electrical and Optical Properties of Ag Doped p-type ZnO Films and Its Homojunctions Properties[J]. Chinese Journal of Luminescence, 2008,29(2): 304-308
SUN Li-jie, ZHONG Sheng, ZHANG Wei-ying, WANG Zheng, LIN Bi-xia, FU Zhu-xi. Electrical and Optical Properties of Ag Doped p-type ZnO Films and Its Homojunctions Properties[J]. Chinese Journal of Luminescence, 2008,29(2): 304-308DOI:
Electrical and Optical Properties of Ag Doped p-type ZnO Films and Its Homojunctions Properties
Ag doped ZnO films have been fabricated on single-crystal Si (100) substrates by magnetron sputtering. XRD measurements show that the ZnO:Ag films have high crystallization quality without new phase related to Ag appearing. Doping with Ag can clearly decreases the neutral donor bound exciton emission showed by the low temperature (10 K) photoluminescence spectra; a donor-acceptor pair emission has been observed at 3.315 eV which is attributed to the formation of acceptor defect (Ag substitutes Zn). The level of AgZn acceptor is estimated to be about 110 meV above valence-band maximum. Hall measurements show that Ag doped ZnO films are p-type conductivity with the resistivity about 0.1 Ω·cm
hole concentration about 1.7×10
18
cm
-3
and mobility about 36 cm
2
/V·s.The two-layer structured ZnO p-n homojunctions have been prepared on Si(100) substrates by depositing Ag doped p-type ZnO film on intrinsic n-type ZnO film using magnetron sputtering. The current-voltage (
I
-
V
) characteristics derived from the intrinsic ZnO/Ag doped ZnO two-layer structure clearly show the rectifying characteristics of typical p-n junctions.
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references
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