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The Investigation of Ellipsometry and DLTS Characteristic for the ZnO Films
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    • The Investigation of Ellipsometry and DLTS Characteristic for the ZnO Films

    • Chinese Journal of Luminescence   Vol. 29, Issue 3, Pages: 495-498(2008)
    • CLC： O471.5

    • Received：25 October 2007，

      Revised：24 December 2007，

      Published：20 May 2008

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  • LIU Ci-hui, SU Jian-feng, ZHANG Wei-ying, TIAN Ke, FU Zhu-xi. The Investigation of Ellipsometry and DLTS Characteristic for the ZnO Films[J]. Chinese Journal of Luminescence, 2008,29(3): 495-498 DOI：

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